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  1. F. Abelès, J. Phys. Rad. II, 310 (1950).
    [CrossRef]
  2. G. Hass, R. E. Thun, Physics of Thin Films (Academic, New York, 1964), Vol. 2, p. 210.

1950 (1)

F. Abelès, J. Phys. Rad. II, 310 (1950).
[CrossRef]

Abelès, F.

F. Abelès, J. Phys. Rad. II, 310 (1950).
[CrossRef]

Hass, G.

G. Hass, R. E. Thun, Physics of Thin Films (Academic, New York, 1964), Vol. 2, p. 210.

Thun, R. E.

G. Hass, R. E. Thun, Physics of Thin Films (Academic, New York, 1964), Vol. 2, p. 210.

J. Phys. Rad. (1)

F. Abelès, J. Phys. Rad. II, 310 (1950).
[CrossRef]

Other (1)

G. Hass, R. E. Thun, Physics of Thin Films (Academic, New York, 1964), Vol. 2, p. 210.

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Figures (2)

Fig. 1
Fig. 1

Calibration substrate made from the optical glass types SF 6 and FK 3. Dimensions in mm.

Fig. 2
Fig. 2

Radiant reflectance R and amplitude reflectance r as a function of the angle of incidence ϕ0.

Tables (1)

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Table I Calibration Angle α and Equivalent Refractive Index nα for a Calibration Substrate Made from the Optical Glasses SF 6 and FK 3 as a Function of the Wavelength λ

Equations (7)

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n β = tan ( β ) .
r 1 = r 2 ,
r i = [ 1 / cos ( α ) n i / cos ( ϕ i ) ] / [ 1 / cos ( α ) + n i / cos ( ϕ i ) ] ( i = 1 , 2 ) ,
sin 4 ( α ) + A    sin 2 ( α ) + B = 0 ,
A = [ 2 ( n 1 n 2 ) 4 ( n 1 2 + n 2 2 ) ] / [ ( n 1 n 2 ) 4 1 ] ,
B = ( n 1 n 2 ) 2 / [ ( n 1 n 2 ) 2 + 1 ] .
sin 2 ( α ) = [ A ( A 2 4 B ) ] / 2 .

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