Abstract

A simplified model is presented to describe the process of optically reading out a video disk. Although limited in versatility and accuracy, the model has the distinct advantage of not requiring computer solutions and of providing a direct physical insight into the diffraction mechanism of video disk readout. The model is semiquantitative in that predictions are in reasonable numerical agreement with more detailed methods of analysis and with experiments.

© 1978 Optical Society of America

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References

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  1. A collection of good review papers is to be found in the IEEE Trans. Consumer Electron. CE-22 (August1976).
  2. R. L. Whitman, A. Korpel, Appl. Opt. 8, 1567 (1969).
    [CrossRef] [PubMed]

1976

A collection of good review papers is to be found in the IEEE Trans. Consumer Electron. CE-22 (August1976).

1969

Appl. Opt.

IEEE Trans. Consumer Electron.

A collection of good review papers is to be found in the IEEE Trans. Consumer Electron. CE-22 (August1976).

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Figures (17)

Fig. 1
Fig. 1

Gaussian beam and Fourier transform by normalized lens.

Fig. 2
Fig. 2

Rectangular beam and Fourier transform by normalized lens.

Fig. 3
Fig. 3

Symbolic transform of equivalent square beam.

Fig. 4
Fig. 4

Symbolic transform of rectangular beam.

Fig. 5
Fig. 5

Portion of pitted disk with readout beam.

Fig. 6
Fig. 6

Illustration of one-track readout assumption.

Fig. 7
Fig. 7

After multiplying with phase constant exp(−jϕ/2), the disk as phase object may be decomposed into uniform phase plate (B) plus amplitude and phase grating (C).

Fig. 8
Fig. 8

Simplification of Fig. 7(C) showing truncation of square illuminating beam.

Fig. 10
Fig. 10

Composite far-field pattern.

Fig. 11
Fig. 11

Heterodyning currents in the far field. Detector sensitivity is normalized so that 1-V/m peak optical amplitude causes a current density of ½ A/m2.

Fig. 12
Fig. 12

Central aperture detection method. The hatched area represents the photodiode.

Fig. 13
Fig. 13

MTF (a) and pit-depth dependence of half wavelength recording (b).

Fig. 14
Fig. 14

Push–pull detection method. The dotted line represents the split in the (hatched) photodiode.

Fig. 15
Fig. 15

MTF (a) and pit dependence of quarter wavelength recording (b).

Fig. 16
Fig. 16

Real focus of zeroth order and virtual foci of first orders (a), generation of phase fringes in far field (b).

Fig. 17
Fig. 17

MTF of half wavelength recording for various out-of-focus conditions.

Equations (8)

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exp ( π x 2 d 2 π y 2 d 2 ) ( upper figure )
d 2 / λ ( lower figure ) .
| I 1 | = 8 π ( 1 d 2 a ) b d ( 1 b d ) sin 2 ϕ 2 .
I 1 = 4 j π d 2 a b d sin ϕ 1 2 a 1 2 d , I 1 = 4 j π ( 1 d 2 a ) b d sin ϕ 1 2 a 1 2 d .
+ 1 order : exp ( j π 4 h λ a 2 j π x h λ a d 2 ) ,
1 order : exp ( j π 4 h λ a 2 + j π x h λ a d 2 ) .
F d = sinc [ π λ h d 2 d 2 a ( 1 d 2 a ) ] .
I t = π 2 b d sin ϕ p sinc 2 ( π p / 2 ) ,

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