A general review of extensive damage measurements using linearly polarized 1064-nm pulses with durations of 125±25 psec is presented. Samples tested included bare polished glass surfaces, several types of dielectric thin films, plastics, diamond-turned and polished metal surfaces, and evaporated metal films. A multiple-beam apparatus which allows rapid measurements of laser-damage thresholds is also described.
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Samples C, D, and E of Owens-Illinois ED-2 had been subjected to surface leaching.18 These samples were supplied by Norman L. Boling of Owens-Illinois.
The fused silica sample was fabricated and supplied by Optical Coating Laboratory, Inc.
Samples of FK-51, a fluorophosphate, were supplied by N. Neuroth of Jenaer Glaswerk Schott and Gen., Mainz.
Energy densities are these in a plane perpendicular to the beam. Polarizers were at Brewster’s angle relative to the input beam for both S and P tests.
Table III
Summary of Laser Damage Thresholds for Metal Surfacesa
Beam incident at 0° unless otherwise noted.
EP = electroplated, HT = heat-treated, DT = diamondturned, R = rinsed, C = cleaned, P = polished.
Data accuracy ± 20%.
Data accuracy ± 10%.
Data accuracy ± 5%.
Tables (3)
Table I
1064-nm 125-psec on Damage Thresholds of Dielectric Surfaces
Samples C, D, and E of Owens-Illinois ED-2 had been subjected to surface leaching.18 These samples were supplied by Norman L. Boling of Owens-Illinois.
The fused silica sample was fabricated and supplied by Optical Coating Laboratory, Inc.
Samples of FK-51, a fluorophosphate, were supplied by N. Neuroth of Jenaer Glaswerk Schott and Gen., Mainz.
Energy densities are these in a plane perpendicular to the beam. Polarizers were at Brewster’s angle relative to the input beam for both S and P tests.
Table III
Summary of Laser Damage Thresholds for Metal Surfacesa
Beam incident at 0° unless otherwise noted.
EP = electroplated, HT = heat-treated, DT = diamondturned, R = rinsed, C = cleaned, P = polished.
Data accuracy ± 20%.
Data accuracy ± 10%.
Data accuracy ± 5%.