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References

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  1. H. D. Downing, D. Williams, J. Geophys. Res. 80, 1656 (1975).
    [Crossref]
  2. D. Chanal, E. Decamps, A. Hadni, H. Wendling, J. Phys. (Paris) 28, 165 (1967).
    [Crossref]
  3. D. T. Hodges, T. S. Hartwick, Appl. Phys. Lett. 23, 252 (1973).
    [Crossref]
  4. K. F. Renk, L. Genzel, Appl. Opt. 1, 643 (1962).
    [Crossref]
  5. D. A. Draegert, N. W. B. Stone, B. Curnutte, D. Williams, J. Opt. Soc. Am. 56, 64 (1966).
    [Crossref]
  6. P. S. Ray, Appl. Opt. 11, 1836 (1972).
    [Crossref] [PubMed]
  7. T. Y. Chang, IEEE Trans. Microwave Theory and Tech. MTT-22, 983 (1974).
    [Crossref]

1975 (1)

H. D. Downing, D. Williams, J. Geophys. Res. 80, 1656 (1975).
[Crossref]

1974 (1)

T. Y. Chang, IEEE Trans. Microwave Theory and Tech. MTT-22, 983 (1974).
[Crossref]

1973 (1)

D. T. Hodges, T. S. Hartwick, Appl. Phys. Lett. 23, 252 (1973).
[Crossref]

1972 (1)

1967 (1)

D. Chanal, E. Decamps, A. Hadni, H. Wendling, J. Phys. (Paris) 28, 165 (1967).
[Crossref]

1966 (1)

1962 (1)

Chanal, D.

D. Chanal, E. Decamps, A. Hadni, H. Wendling, J. Phys. (Paris) 28, 165 (1967).
[Crossref]

Chang, T. Y.

T. Y. Chang, IEEE Trans. Microwave Theory and Tech. MTT-22, 983 (1974).
[Crossref]

Curnutte, B.

Decamps, E.

D. Chanal, E. Decamps, A. Hadni, H. Wendling, J. Phys. (Paris) 28, 165 (1967).
[Crossref]

Downing, H. D.

H. D. Downing, D. Williams, J. Geophys. Res. 80, 1656 (1975).
[Crossref]

Draegert, D. A.

Genzel, L.

Hadni, A.

D. Chanal, E. Decamps, A. Hadni, H. Wendling, J. Phys. (Paris) 28, 165 (1967).
[Crossref]

Hartwick, T. S.

D. T. Hodges, T. S. Hartwick, Appl. Phys. Lett. 23, 252 (1973).
[Crossref]

Hodges, D. T.

D. T. Hodges, T. S. Hartwick, Appl. Phys. Lett. 23, 252 (1973).
[Crossref]

Ray, P. S.

Renk, K. F.

Stone, N. W. B.

Wendling, H.

D. Chanal, E. Decamps, A. Hadni, H. Wendling, J. Phys. (Paris) 28, 165 (1967).
[Crossref]

Williams, D.

Appl. Opt. (2)

Appl. Phys. Lett. (1)

D. T. Hodges, T. S. Hartwick, Appl. Phys. Lett. 23, 252 (1973).
[Crossref]

IEEE Trans. Microwave Theory and Tech. (1)

T. Y. Chang, IEEE Trans. Microwave Theory and Tech. MTT-22, 983 (1974).
[Crossref]

J. Geophys. Res. (1)

H. D. Downing, D. Williams, J. Geophys. Res. 80, 1656 (1975).
[Crossref]

J. Opt. Soc. Am. (1)

J. Phys. (Paris) (1)

D. Chanal, E. Decamps, A. Hadni, H. Wendling, J. Phys. (Paris) 28, 165 (1967).
[Crossref]

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Figures (3)

Fig. 1
Fig. 1

Block diagram of the experimental apparatus. M, mirrors; G, grating; SA, spectrum analyzer; C, chopper; BS, beam splitter; D, detectors; FP, Fabry-Perot interferometer; SC, sample cell; A, amplifier; and S, dual trace oscilloscope.

Fig. 2
Fig. 2

Relative value of the natural logarithm of TM vs cell thickness for λ = 232.9 μm.

Fig. 3
Fig. 3

Measured values of the absorption coefficient at four wavelengths. The solid curve was generated from experimental data in Ref. 1.

Equations (1)

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ln T M = ln I T I R = ln C - α ( λ ) t .

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