Abstract

The use of lateral shear interferometers for measuring the optical transfer function of an optical system for a white light source is investigated. It is shown that grating lateral shear interferometers fulfill the requirements necessary to perform measurements of both the optical transfer function and the optical coherence function for a white light source. Several possible grating lateral shear interferometers are described.

© 1975 Optical Society of America

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References

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  1. H. H. Hopkins, Opt. Acta 2, 23 (1955).
    [Crossref]
  2. L. R. Baker, Proc. Phys. Soc. Lond. B 68, 871 (1955).
    [Crossref]
  3. D. Kelsall, Proc. Phys. Soc. Lond. 73, 465 (1959).
    [Crossref]
  4. P. Hariharan, D. Sen, Proc. Phys. Soc. Lond. 75, 434 (1960).
    [Crossref]
  5. T. Tsurata, J. Opt. Soc. Am. 53, 1156 (1963).
    [Crossref]
  6. A. J. Montgomery, J. Opt. Soc. Am. 54, 191 (1964).
    [Crossref]
  7. W. H. Steel, Opt. Acta 11, 9 (1964).
    [Crossref]
  8. D. Kelsall, Appl. Opt. 12, 1398 (1973).
    [Crossref] [PubMed]
  9. D. Kelsall, J. Opt. Soc. Am. 63, 1472 (1973).
    [Crossref]
  10. J. C. Wyant, Appl. Opt. 12, 2057 (1973).
    [Crossref] [PubMed]
  11. P. Hariharan, W. H. Steel, J. C. Wyant, Opt. Commun. 11, 317 (1974).
    [Crossref]
  12. M. P. Rimmer, J. C. Wyant, Appl. Opt. 14, 142 (1975).
    [PubMed]
  13. J. C. Wyant, Appl. Opt. 13, 202 (1974).
  14. D. W. Cutter, A. W. Lohmann, Opt. Commun. 12, 220 (1974).
    [Crossref]
  15. See, for example, K. Murata, in Progress in Optics, E. Wolf, Ed. (North-Holland, Amsterdam, 1966), Vol. 5, pp. 201–232.
    [Crossref]

1975 (1)

1974 (3)

P. Hariharan, W. H. Steel, J. C. Wyant, Opt. Commun. 11, 317 (1974).
[Crossref]

J. C. Wyant, Appl. Opt. 13, 202 (1974).

D. W. Cutter, A. W. Lohmann, Opt. Commun. 12, 220 (1974).
[Crossref]

1973 (3)

1964 (2)

1963 (1)

1960 (1)

P. Hariharan, D. Sen, Proc. Phys. Soc. Lond. 75, 434 (1960).
[Crossref]

1959 (1)

D. Kelsall, Proc. Phys. Soc. Lond. 73, 465 (1959).
[Crossref]

1955 (2)

H. H. Hopkins, Opt. Acta 2, 23 (1955).
[Crossref]

L. R. Baker, Proc. Phys. Soc. Lond. B 68, 871 (1955).
[Crossref]

Baker, L. R.

L. R. Baker, Proc. Phys. Soc. Lond. B 68, 871 (1955).
[Crossref]

Cutter, D. W.

D. W. Cutter, A. W. Lohmann, Opt. Commun. 12, 220 (1974).
[Crossref]

Hariharan, P.

P. Hariharan, W. H. Steel, J. C. Wyant, Opt. Commun. 11, 317 (1974).
[Crossref]

P. Hariharan, D. Sen, Proc. Phys. Soc. Lond. 75, 434 (1960).
[Crossref]

Hopkins, H. H.

H. H. Hopkins, Opt. Acta 2, 23 (1955).
[Crossref]

Kelsall, D.

Lohmann, A. W.

D. W. Cutter, A. W. Lohmann, Opt. Commun. 12, 220 (1974).
[Crossref]

Montgomery, A. J.

Murata, K.

See, for example, K. Murata, in Progress in Optics, E. Wolf, Ed. (North-Holland, Amsterdam, 1966), Vol. 5, pp. 201–232.
[Crossref]

Rimmer, M. P.

Sen, D.

P. Hariharan, D. Sen, Proc. Phys. Soc. Lond. 75, 434 (1960).
[Crossref]

Steel, W. H.

P. Hariharan, W. H. Steel, J. C. Wyant, Opt. Commun. 11, 317 (1974).
[Crossref]

W. H. Steel, Opt. Acta 11, 9 (1964).
[Crossref]

Tsurata, T.

Wyant, J. C.

M. P. Rimmer, J. C. Wyant, Appl. Opt. 14, 142 (1975).
[PubMed]

P. Hariharan, W. H. Steel, J. C. Wyant, Opt. Commun. 11, 317 (1974).
[Crossref]

J. C. Wyant, Appl. Opt. 13, 202 (1974).

J. C. Wyant, Appl. Opt. 12, 2057 (1973).
[Crossref] [PubMed]

Appl. Opt. (4)

J. Opt. Soc. Am. (3)

Opt. Acta (2)

W. H. Steel, Opt. Acta 11, 9 (1964).
[Crossref]

H. H. Hopkins, Opt. Acta 2, 23 (1955).
[Crossref]

Opt. Commun. (2)

P. Hariharan, W. H. Steel, J. C. Wyant, Opt. Commun. 11, 317 (1974).
[Crossref]

D. W. Cutter, A. W. Lohmann, Opt. Commun. 12, 220 (1974).
[Crossref]

Proc. Phys. Soc. Lond. (2)

D. Kelsall, Proc. Phys. Soc. Lond. 73, 465 (1959).
[Crossref]

P. Hariharan, D. Sen, Proc. Phys. Soc. Lond. 75, 434 (1960).
[Crossref]

Proc. Phys. Soc. Lond. B (1)

L. R. Baker, Proc. Phys. Soc. Lond. B 68, 871 (1955).
[Crossref]

Other (1)

See, for example, K. Murata, in Progress in Optics, E. Wolf, Ed. (North-Holland, Amsterdam, 1966), Vol. 5, pp. 201–232.
[Crossref]

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Figures (3)

Fig. 1
Fig. 1

Grating shearing OTF measuring interferometer for use with white light.

Fig. 2
Fig. 2

Afocal lens system to eliminate undesired diffraction orders.

Fig. 3
Fig. 3

Two frequency diffraction interferometer having variable difference frequency for measuring OTF.

Equations (10)

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D ( ν x , ψ ) = 1 C A f ( x + 1 2 S , y ) f * ( x 1 2 S , y ) dxdy = | D ( ν x , ψ ) | exp [ i θ ( ν x , ψ ) ] ,
S = D λ ( f no ) ν x .
F ( δ , S , ψ ) = | f ( x + 1 2 S , y ) + f * ( x 1 2 S , y ) exp ( i δ ) | 2 dxdy = 2 C { 1 + | D ( ν x , ψ ) | cos [ δ θ ( ν x , ψ ) ] } .
δ = ω t + ϕ 0 ,
S = ( 2 λ / d ) L ,
δ = 2 π ( 2 υ / d ) t + ϕ 0 ,
Δ α = λ ( 1 d 2 1 d 1 ) .
ω = 2 π υ ( 1 d 2 1 d 1 ) .
percentage shear = [ 4 f no sin ( α / 2 ) ] λ / d .
F ( δ , S , ψ ) = 2 C { 1 + | γ ( ν x , ψ ) | | D ( ν x , ψ ) | × cos [ δ β ( ν x , ψ ) θ ( ν x , ψ ) ] } ,

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