Abstract

We describe a semiautomatic procedure for the reduction of high-dispersion echelle spectra recorded with an image tube. The spectra are traced with a computer-controlled microdensitometer that scans along the curved spectral orders. The curvature of each order is calculated approximately by a fortran program from known grating and distortion parameters. A typical spectrum includes 25 orders (covering 1500 Å) and is traced with a slit 0.012 Å wide. To produce an atlas of intensity vs wavelength and to determine the equivalent widths of 300 lines currently require a day. We discuss the reduction procedures and time requirements in detail.

© 1975 Optical Society of America

Automatic Measurement, Reduction and Recording of Wavelengths from Spectrograms

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J. Opt. Soc. Am. 25(6) 169-178 (1935)

Automatic precision measurement of spectrograms

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