Abstract

Refractive index profiles resulting from the fabrication of optical waveguides by diffusion techniques are measured using a reflection interferometric technique. In Cd-diffused ZnSe waveguides, the index variations are found to be complementary error functions that closely follow the composition changes for deep (>5 μm) diffusions. Shallow (<5 μm) diffusions produce waveguides in which the index profile is a complementary error function that differs significantly from the composition profile. The relationship between composition and refractive index is determined for Cd compositions less than 10%. Refractive index profiles in commercially available diffused glass waveguides (SELFOC rod and fibers) are also described.

© 1974 Optical Society of America

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription