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  1. M. Sparks, J. Appl. Phys. 42, 5029 (1971).
    [CrossRef]
  2. J. R. Jasperse, P. D. Gianino, J. Appl. Phys. 43, 1686 (1972).
    [CrossRef]
  3. B. Bendow, J. R. Jasperse, P. D. Gianino, Opt. Commun. 5, 98 (1972).
    [CrossRef]
  4. J. Pappis in Conference on High Power Infrared Laser Window Materials, C. Sahagian, C. A. Pitha, Eds. (AFCRL-71-0592, Bedford, Mass., 1971).
  5. See, for example, R. Weil, J. Appl. Phys. 40, 2857 (1969); J. Appl. Phys. 40, 4681 (1969).
    [CrossRef]
  6. J. N. Dukes, G. B. Gordon, Hewlett-Packard J. 21, No. 12 (1970).
  7. L. H. Skolnik, A. Hordvik, A. Kahan, Appl. Phys. Lett. 23, 477 (1973).
    [CrossRef]
  8. (a) J. Pappis, Raytheon Research Labs., Waltham, Mass., private communication; (b) J. R. Kurdock, Quarterly Progress Rpt. 2 on AF contract F33615-73-C-5127, 19 Oct. 73. The refractive index for Kodak Irtran 4 (hot-pressed ZnSe) is approximately 2.41 from (c) Kodak Irtran Infrared Optical Materials (Kodak Publication U-72, Eastman Kodak Co., 1971).
  9. Y. Tsay, B. Bendow, S. S. Mitra, Phys. Rev. B 8, 2688 (1973).
    [CrossRef]
  10. V. V. Zhdanova, V. P. Sargeev, Sov. Phys. Solid State 14, 1859 (1973).
  11. A. R. Hilton, C. E. Jones, Appl. Opt. 6, 1513 (1967).
    [CrossRef] [PubMed]
  12. O. A. Kolosovskii, L. N. Ustimenko, Opt. Spectrosc. 33, 430 (1972).
  13. B. Bendow, P. D. Gianino, “Theory of On-Axis Intensity Distribution in Thermal Lensing,” AFCRL-72-0372, May1972, p. 15.

1973 (3)

L. H. Skolnik, A. Hordvik, A. Kahan, Appl. Phys. Lett. 23, 477 (1973).
[CrossRef]

Y. Tsay, B. Bendow, S. S. Mitra, Phys. Rev. B 8, 2688 (1973).
[CrossRef]

V. V. Zhdanova, V. P. Sargeev, Sov. Phys. Solid State 14, 1859 (1973).

1972 (3)

J. R. Jasperse, P. D. Gianino, J. Appl. Phys. 43, 1686 (1972).
[CrossRef]

B. Bendow, J. R. Jasperse, P. D. Gianino, Opt. Commun. 5, 98 (1972).
[CrossRef]

O. A. Kolosovskii, L. N. Ustimenko, Opt. Spectrosc. 33, 430 (1972).

1971 (1)

M. Sparks, J. Appl. Phys. 42, 5029 (1971).
[CrossRef]

1970 (1)

J. N. Dukes, G. B. Gordon, Hewlett-Packard J. 21, No. 12 (1970).

1969 (1)

See, for example, R. Weil, J. Appl. Phys. 40, 2857 (1969); J. Appl. Phys. 40, 4681 (1969).
[CrossRef]

1967 (1)

Bendow, B.

Y. Tsay, B. Bendow, S. S. Mitra, Phys. Rev. B 8, 2688 (1973).
[CrossRef]

B. Bendow, J. R. Jasperse, P. D. Gianino, Opt. Commun. 5, 98 (1972).
[CrossRef]

B. Bendow, P. D. Gianino, “Theory of On-Axis Intensity Distribution in Thermal Lensing,” AFCRL-72-0372, May1972, p. 15.

Dukes, J. N.

J. N. Dukes, G. B. Gordon, Hewlett-Packard J. 21, No. 12 (1970).

Gianino, P. D.

B. Bendow, J. R. Jasperse, P. D. Gianino, Opt. Commun. 5, 98 (1972).
[CrossRef]

J. R. Jasperse, P. D. Gianino, J. Appl. Phys. 43, 1686 (1972).
[CrossRef]

B. Bendow, P. D. Gianino, “Theory of On-Axis Intensity Distribution in Thermal Lensing,” AFCRL-72-0372, May1972, p. 15.

Gordon, G. B.

J. N. Dukes, G. B. Gordon, Hewlett-Packard J. 21, No. 12 (1970).

Hilton, A. R.

Hordvik, A.

L. H. Skolnik, A. Hordvik, A. Kahan, Appl. Phys. Lett. 23, 477 (1973).
[CrossRef]

Jasperse, J. R.

B. Bendow, J. R. Jasperse, P. D. Gianino, Opt. Commun. 5, 98 (1972).
[CrossRef]

J. R. Jasperse, P. D. Gianino, J. Appl. Phys. 43, 1686 (1972).
[CrossRef]

Jones, C. E.

Kahan, A.

L. H. Skolnik, A. Hordvik, A. Kahan, Appl. Phys. Lett. 23, 477 (1973).
[CrossRef]

Kolosovskii, O. A.

O. A. Kolosovskii, L. N. Ustimenko, Opt. Spectrosc. 33, 430 (1972).

Mitra, S. S.

Y. Tsay, B. Bendow, S. S. Mitra, Phys. Rev. B 8, 2688 (1973).
[CrossRef]

Pappis, J.

(a) J. Pappis, Raytheon Research Labs., Waltham, Mass., private communication; (b) J. R. Kurdock, Quarterly Progress Rpt. 2 on AF contract F33615-73-C-5127, 19 Oct. 73. The refractive index for Kodak Irtran 4 (hot-pressed ZnSe) is approximately 2.41 from (c) Kodak Irtran Infrared Optical Materials (Kodak Publication U-72, Eastman Kodak Co., 1971).

J. Pappis in Conference on High Power Infrared Laser Window Materials, C. Sahagian, C. A. Pitha, Eds. (AFCRL-71-0592, Bedford, Mass., 1971).

Sargeev, V. P.

V. V. Zhdanova, V. P. Sargeev, Sov. Phys. Solid State 14, 1859 (1973).

Skolnik, L. H.

L. H. Skolnik, A. Hordvik, A. Kahan, Appl. Phys. Lett. 23, 477 (1973).
[CrossRef]

Sparks, M.

M. Sparks, J. Appl. Phys. 42, 5029 (1971).
[CrossRef]

Tsay, Y.

Y. Tsay, B. Bendow, S. S. Mitra, Phys. Rev. B 8, 2688 (1973).
[CrossRef]

Ustimenko, L. N.

O. A. Kolosovskii, L. N. Ustimenko, Opt. Spectrosc. 33, 430 (1972).

Weil, R.

See, for example, R. Weil, J. Appl. Phys. 40, 2857 (1969); J. Appl. Phys. 40, 4681 (1969).
[CrossRef]

Zhdanova, V. V.

V. V. Zhdanova, V. P. Sargeev, Sov. Phys. Solid State 14, 1859 (1973).

Appl. Opt. (1)

Appl. Phys. Lett. (1)

L. H. Skolnik, A. Hordvik, A. Kahan, Appl. Phys. Lett. 23, 477 (1973).
[CrossRef]

Hewlett-Packard J. (1)

J. N. Dukes, G. B. Gordon, Hewlett-Packard J. 21, No. 12 (1970).

J. Appl. Phys. (3)

See, for example, R. Weil, J. Appl. Phys. 40, 2857 (1969); J. Appl. Phys. 40, 4681 (1969).
[CrossRef]

M. Sparks, J. Appl. Phys. 42, 5029 (1971).
[CrossRef]

J. R. Jasperse, P. D. Gianino, J. Appl. Phys. 43, 1686 (1972).
[CrossRef]

Opt. Commun. (1)

B. Bendow, J. R. Jasperse, P. D. Gianino, Opt. Commun. 5, 98 (1972).
[CrossRef]

Opt. Spectrosc. (1)

O. A. Kolosovskii, L. N. Ustimenko, Opt. Spectrosc. 33, 430 (1972).

Phys. Rev. B (1)

Y. Tsay, B. Bendow, S. S. Mitra, Phys. Rev. B 8, 2688 (1973).
[CrossRef]

Sov. Phys. Solid State (1)

V. V. Zhdanova, V. P. Sargeev, Sov. Phys. Solid State 14, 1859 (1973).

Other (3)

B. Bendow, P. D. Gianino, “Theory of On-Axis Intensity Distribution in Thermal Lensing,” AFCRL-72-0372, May1972, p. 15.

J. Pappis in Conference on High Power Infrared Laser Window Materials, C. Sahagian, C. A. Pitha, Eds. (AFCRL-71-0592, Bedford, Mass., 1971).

(a) J. Pappis, Raytheon Research Labs., Waltham, Mass., private communication; (b) J. R. Kurdock, Quarterly Progress Rpt. 2 on AF contract F33615-73-C-5127, 19 Oct. 73. The refractive index for Kodak Irtran 4 (hot-pressed ZnSe) is approximately 2.41 from (c) Kodak Irtran Infrared Optical Materials (Kodak Publication U-72, Eastman Kodak Co., 1971).

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Figures (3)

Fig. 1
Fig. 1

Experimental setup used to measure (dn)/(dT) with laser Doppler interferometer.

Fig. 2
Fig. 2

Temperature rise vs change in optical path at 6328 Å for Raytheon CVD ZnSe as measured by LDI—sample thickness is 0.75 cm.

Fig. 3
Fig. 3

Transmission at 10.6 μm vs temperature rise for Raytheon CVD ZnSe with L = 0.75 cm. The temperature separation of the fringe maxima is ~5.75°C.

Tables (1)

Tables Icon

Table I Temperature Derivative of the Refractive Index of ZnSe at 10.6 μm

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

T = ( 4 n 2 ) / [ 4 n 2 + ( n 2 1 ) 2 sin 2 ( 2 π n L / λ ) ] ,
( d n ) / ( d T ) = { λ / [ 2 L ( Δ T ) / ( Δ K ) ] } n α ,
[ ( d n ) / ( d T ) ] ( 23 62 ° C ) = 1.0 × 10 4 / ° C .

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