Abstract

An asymmetry measure is introduced to characterize thin-film optical waveguides that are asymmetric in refractive index. Together with the usual normalized frequency this allows the plotting of universal charts from which the guide cutoff, the effective guide index, and the effective guide thickness can be determined by the use of simple scaling rules. The minimum value of the effective guide thickness is found to be a simple function of wavelength and the film and substrate indices.

© 1974 Optical Society of America

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