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References

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  1. A. F. Fercher, M. Kriese, Optik 35, 168(1972).
  2. A. F. Fercher, P. Skalicky, J. Tomiser, Opt. Laser Tech. 5, 75(1973).
    [CrossRef]
  3. B. R. Brown, A. W. Lohmann, Appl. Opt. 5, 967(1966).
    [CrossRef] [PubMed]
  4. A. W. Lohmann, D. P. Paris, Appl. Opt. 6, 1739(1967).
    [CrossRef] [PubMed]
  5. O. Bryngdahl, A. W. Lohmann, J. Opt. Soc. Am. 58, 141(1968).
    [CrossRef]
  6. O. Bryngdahl, J. Opt. Soc. Am. 59, 142(1969).
    [CrossRef]
  7. K. Matsumato, M. Takashima, J. Opt. Soc. Am. 60, 30(1970).
    [CrossRef]

1973 (1)

A. F. Fercher, P. Skalicky, J. Tomiser, Opt. Laser Tech. 5, 75(1973).
[CrossRef]

1972 (1)

A. F. Fercher, M. Kriese, Optik 35, 168(1972).

1970 (1)

1969 (1)

1968 (1)

1967 (1)

1966 (1)

Brown, B. R.

Bryngdahl, O.

Fercher, A. F.

A. F. Fercher, P. Skalicky, J. Tomiser, Opt. Laser Tech. 5, 75(1973).
[CrossRef]

A. F. Fercher, M. Kriese, Optik 35, 168(1972).

Kriese, M.

A. F. Fercher, M. Kriese, Optik 35, 168(1972).

Lohmann, A. W.

Matsumato, K.

Paris, D. P.

Skalicky, P.

A. F. Fercher, P. Skalicky, J. Tomiser, Opt. Laser Tech. 5, 75(1973).
[CrossRef]

Takashima, M.

Tomiser, J.

A. F. Fercher, P. Skalicky, J. Tomiser, Opt. Laser Tech. 5, 75(1973).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Experimental setup for testing plot.

Fig. 2
Fig. 2

Laser beam recorder plot.

Fig. 3
Fig. 3

Distortion in x direction (200 μm per wave).

Fig. 4
Fig. 4

Error in laser beam recorder lines (200 μm per fringe).

Equations (2)

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[ x / ( Δ x ) ] + { [ δ x ( x , y ) ] / ( Δ x ) } = M .
x sin θ λ + ϕ ( x , y ) λ = M .

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