Abstract
A method for the evaluation of the two-dimensional MTF of x-ray systems is described. In a first step a statistical distribution of lead grains is imaged by the x-ray systems. In the second step this image is Fourier transformed in a coherent optical processor giving the two-dimensional display of the MTF. A demonstration of the method is given by showing the dependence of the MTF on shape and size of the focal spot of the x-ray tube and the nonshift invariance of a system using a rotating anode tube. Furthermore the application of the method in tomographic x-ray systems is tested.
© 1973 Optical Society of America
Full Article | PDF ArticleOSA Recommended Articles
Liqiang Ren, Zhongxing Zhou, Muhammad U. Ghani, Yuhua Li, and Hong Liu
Opt. Express 22(18) 21199-21213 (2014)
Martin Trefler and Joel E. Gray
Appl. Opt. 15(12) 3099-3104 (1976)
John F. Seely, Glenn E. Holland, Lawrence T. Hudson, and Albert Henins
Appl. Opt. 47(31) 5753-5761 (2008)

