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References

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  1. B. M. Oliver, Proc. IEEE 51, 220 (1963).
    [Crossref]
  2. J. W. Goodman, Proc. IEEE 53, 1688 (1965).
    [Crossref]
  3. J. C. Dainty, Opt. Acta. 17, 10, 761 (1970).
    [Crossref]
  4. G. Groh, in Engineering Uses of Holography, E. R. Robertson, J. M. Harvey, Eds. (Cambridge U.P., London, 1970), p. 483.
  5. E. Marom, Appl. Opt., 9, 6, 1385 (1970).
    [Crossref]
  6. S. Ohue, Oyo Butsuri (Japan) 28, 531 (1959).
  7. A. W. Lohmann, Opt. Commun. 3, 2, 73 (1971).
    [Crossref]

1971 (1)

A. W. Lohmann, Opt. Commun. 3, 2, 73 (1971).
[Crossref]

1970 (2)

J. C. Dainty, Opt. Acta. 17, 10, 761 (1970).
[Crossref]

E. Marom, Appl. Opt., 9, 6, 1385 (1970).
[Crossref]

1965 (1)

J. W. Goodman, Proc. IEEE 53, 1688 (1965).
[Crossref]

1963 (1)

B. M. Oliver, Proc. IEEE 51, 220 (1963).
[Crossref]

1959 (1)

S. Ohue, Oyo Butsuri (Japan) 28, 531 (1959).

Dainty, J. C.

J. C. Dainty, Opt. Acta. 17, 10, 761 (1970).
[Crossref]

Goodman, J. W.

J. W. Goodman, Proc. IEEE 53, 1688 (1965).
[Crossref]

Groh, G.

G. Groh, in Engineering Uses of Holography, E. R. Robertson, J. M. Harvey, Eds. (Cambridge U.P., London, 1970), p. 483.

Lohmann, A. W.

A. W. Lohmann, Opt. Commun. 3, 2, 73 (1971).
[Crossref]

Marom, E.

E. Marom, Appl. Opt., 9, 6, 1385 (1970).
[Crossref]

Ohue, S.

S. Ohue, Oyo Butsuri (Japan) 28, 531 (1959).

Oliver, B. M.

B. M. Oliver, Proc. IEEE 51, 220 (1963).
[Crossref]

Appl. Opt. (1)

E. Marom, Appl. Opt., 9, 6, 1385 (1970).
[Crossref]

Opt. Acta. (1)

J. C. Dainty, Opt. Acta. 17, 10, 761 (1970).
[Crossref]

Opt. Commun. (1)

A. W. Lohmann, Opt. Commun. 3, 2, 73 (1971).
[Crossref]

Oyo Butsuri (Japan) (1)

S. Ohue, Oyo Butsuri (Japan) 28, 531 (1959).

Proc. IEEE (2)

B. M. Oliver, Proc. IEEE 51, 220 (1963).
[Crossref]

J. W. Goodman, Proc. IEEE 53, 1688 (1965).
[Crossref]

Other (1)

G. Groh, in Engineering Uses of Holography, E. R. Robertson, J. M. Harvey, Eds. (Cambridge U.P., London, 1970), p. 483.

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Figures (2)

Fig. 1
Fig. 1

Optical system to detect image plane: O, object plane (coherent light source); A, optical system (lens); S1, location of diffuser; S2, location of projection screen.

Fig. 2
Fig. 2

Experimental results: variations of speckle pattern (top row) on S2 of Fig. 1, beam waist on S1 observed through a microscope (middle row), and direct pattern on S1 observed by unaided eye (camera F = 16) are compared, where parameter is the displacement of the screen S1 (z).

Equations (4)

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f max = ( 2 π / λ ) sin 2 θ = ( 2 π / λ ) [ w ( z ) / l ] ,
S = 2 π / f max = λ l / w ( z )
P w = Δ w / Δ z = d w / d z and P s = Δ S / Δ z = - ( λ l / w 2 ) ( d w / d z ) .
P = P s / P w = - ( λ l / w 2 ) .

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