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References

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  1. J. J. O. Palgen, Patt. Recogn. 2, 255 (1970).
    [Crossref]
  2. G. G. Lendaris, G. L. Stanley, Proc IEEE 58, 198 (1970).
    [Crossref]

1970 (2)

J. J. O. Palgen, Patt. Recogn. 2, 255 (1970).
[Crossref]

G. G. Lendaris, G. L. Stanley, Proc IEEE 58, 198 (1970).
[Crossref]

Lendaris, G. G.

G. G. Lendaris, G. L. Stanley, Proc IEEE 58, 198 (1970).
[Crossref]

Palgen, J. J. O.

J. J. O. Palgen, Patt. Recogn. 2, 255 (1970).
[Crossref]

Stanley, G. L.

G. G. Lendaris, G. L. Stanley, Proc IEEE 58, 198 (1970).
[Crossref]

Patt. Recogn. (1)

J. J. O. Palgen, Patt. Recogn. 2, 255 (1970).
[Crossref]

Proc IEEE (1)

G. G. Lendaris, G. L. Stanley, Proc IEEE 58, 198 (1970).
[Crossref]

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Figures (2)

Fig. 1
Fig. 1

Experimental setup. O object transparency, Z zoom objective, F Fourier plane, M magnifying lens, S diaphragm, L collecting lens, D detector.

Fig. 2
Fig. 2

Energy distribution of the frequency pattern of a slit aperture of w = 0.5 mm, as sampled by constant-width apertures (broken line) and scanned by zoom (solid line). The slight miscoincidence of the peak positions is due to the fact that the broken curve has its maxima at πu = tan πu and the solid curve at 2πu = tanπu. For the first peak, the positional difference is about 2%.

Equations (4)

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I ( x / f ) = const · [ sin k ( x / f ) · w k ( x / f ) · w ] 2 ,
I ( x / f ) = const · { 1 / [ k ( x / f ) · w ] 2 } .
P i = P ( x i / f ) α ( Δ x / f ) [ k ( x i / f ) · w ] 2 α x i - 2 .
P i = P ( x / f i ) α ( Δ x / f i ) [ k ( x / f i ) · w ] 2 α f i .

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