Abstract

An easily implemented method of measuring in-plane surface displacement by photographing an object through two laterally displaced apertures is described and the experimental results are presented. The displacement is displayed as a pattern of moiré fringes over the image. No previously constructed grids or rulings are required as in normal moiré devices. The method is noncontacting and requires no special surface preparation. The sensitivity is easily adjusted and is shown to be equivalent to that obtained using double-exposure holography or speckle pattern interferometry techniques. The method has potential application in mechanically unstable environments or where the conditions are such that grids or strain gauges cannot be attached to the object.

© 1972 Optical Society of America

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References

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  1. R. E. Brooks, L. O. Heflinger, Appl. Opt. 8, 935 (1969).
    [CrossRef] [PubMed]
  2. R. W. E. Cook, Opt. Laser Technol. 3, 71 (1971).
    [CrossRef]
  3. A. E. Ennos, J. Phys. E (Sci. Instrum.) 1, 731 (1968).
    [CrossRef]
  4. J. W. C. Gates, Opt. Technol. 2, 247 (1969).
    [CrossRef]
  5. J. A. Leendertz, J. Phys. E (Sci. Instrum.) 3, 214 (1970).
    [CrossRef]
  6. J. N. Butters, J. A. Leendertz, J. Phys. E (Sci. Instrum.) 4, 277 (1971).
    [CrossRef]
  7. E. Archbold, J. M. Burch, A. E. Ennos, Optica Acta 17, 883 (1970).
    [CrossRef]
  8. Y. Nishijima, G. Oster, J. Opt. Soc. Am. 54, 1 (1964).
    [CrossRef]

1971

R. W. E. Cook, Opt. Laser Technol. 3, 71 (1971).
[CrossRef]

J. N. Butters, J. A. Leendertz, J. Phys. E (Sci. Instrum.) 4, 277 (1971).
[CrossRef]

1970

E. Archbold, J. M. Burch, A. E. Ennos, Optica Acta 17, 883 (1970).
[CrossRef]

J. A. Leendertz, J. Phys. E (Sci. Instrum.) 3, 214 (1970).
[CrossRef]

1969

1968

A. E. Ennos, J. Phys. E (Sci. Instrum.) 1, 731 (1968).
[CrossRef]

1964

Archbold, E.

E. Archbold, J. M. Burch, A. E. Ennos, Optica Acta 17, 883 (1970).
[CrossRef]

Brooks, R. E.

Burch, J. M.

E. Archbold, J. M. Burch, A. E. Ennos, Optica Acta 17, 883 (1970).
[CrossRef]

Butters, J. N.

J. N. Butters, J. A. Leendertz, J. Phys. E (Sci. Instrum.) 4, 277 (1971).
[CrossRef]

Cook, R. W. E.

R. W. E. Cook, Opt. Laser Technol. 3, 71 (1971).
[CrossRef]

Ennos, A. E.

E. Archbold, J. M. Burch, A. E. Ennos, Optica Acta 17, 883 (1970).
[CrossRef]

A. E. Ennos, J. Phys. E (Sci. Instrum.) 1, 731 (1968).
[CrossRef]

Gates, J. W. C.

J. W. C. Gates, Opt. Technol. 2, 247 (1969).
[CrossRef]

Heflinger, L. O.

Leendertz, J. A.

J. N. Butters, J. A. Leendertz, J. Phys. E (Sci. Instrum.) 4, 277 (1971).
[CrossRef]

J. A. Leendertz, J. Phys. E (Sci. Instrum.) 3, 214 (1970).
[CrossRef]

Nishijima, Y.

Oster, G.

Appl. Opt.

J. Opt. Soc. Am.

J. Phys. E (Sci. Instrum.)

J. A. Leendertz, J. Phys. E (Sci. Instrum.) 3, 214 (1970).
[CrossRef]

J. N. Butters, J. A. Leendertz, J. Phys. E (Sci. Instrum.) 4, 277 (1971).
[CrossRef]

A. E. Ennos, J. Phys. E (Sci. Instrum.) 1, 731 (1968).
[CrossRef]

Opt. Laser Technol.

R. W. E. Cook, Opt. Laser Technol. 3, 71 (1971).
[CrossRef]

Opt. Technol.

J. W. C. Gates, Opt. Technol. 2, 247 (1969).
[CrossRef]

Optica Acta

E. Archbold, J. M. Burch, A. E. Ennos, Optica Acta 17, 883 (1970).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Recording conditions for producing grid in speckle pattern image.

Fig. 2
Fig. 2

Enlarged view of section of image plane showing grid structure in speckle pattern.

Fig. 3
Fig. 3

Fringes obtained using double aperture imaging technique. Plate rotated about axis normal to surface between double exposure.

Fig. 4
Fig. 4

In-plane displacement fringes produced by lateral compression of arms of U-shaped clamp.

Equations (7)

Equations on this page are rendered with MathJax. Learn more.

δ i = λ / 2 sin α .
tan α sin α D / 2 q ,
δ i = λ p m / D .
δ o = λ p / D .
N = δ / δ i .
δ = λ q / d .
N = D / d .

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