Abstract

A method of enhancing discrimination between adjacent channels in a binary coded array is described. A discussion is given of the application of this method to a photon counting system employing a static Gray-scale mask and to a system that employs a sequence of dynamically switched Gray-scale coded structures to produce a scanning electron beam.

© 1972 Optical Society of America

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References

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  1. B. L. Landrum, L. A. Jeffreys, in Proceedings of the Symposium on Information Displays and Recording, Wright-Patterson AFB, 8April1969.
  2. P. Iredale, G. W. Hinder, D. W. S. Smout, Advan. Elec. tron. Electron Phys. 28B, 965 (1969).
    [CrossRef]

1969 (1)

P. Iredale, G. W. Hinder, D. W. S. Smout, Advan. Elec. tron. Electron Phys. 28B, 965 (1969).
[CrossRef]

Hinder, G. W.

P. Iredale, G. W. Hinder, D. W. S. Smout, Advan. Elec. tron. Electron Phys. 28B, 965 (1969).
[CrossRef]

Iredale, P.

P. Iredale, G. W. Hinder, D. W. S. Smout, Advan. Elec. tron. Electron Phys. 28B, 965 (1969).
[CrossRef]

Jeffreys, L. A.

B. L. Landrum, L. A. Jeffreys, in Proceedings of the Symposium on Information Displays and Recording, Wright-Patterson AFB, 8April1969.

Landrum, B. L.

B. L. Landrum, L. A. Jeffreys, in Proceedings of the Symposium on Information Displays and Recording, Wright-Patterson AFB, 8April1969.

Smout, D. W. S.

P. Iredale, G. W. Hinder, D. W. S. Smout, Advan. Elec. tron. Electron Phys. 28B, 965 (1969).
[CrossRef]

Advan. Elec. tron. Electron Phys. (1)

P. Iredale, G. W. Hinder, D. W. S. Smout, Advan. Elec. tron. Electron Phys. 28B, 965 (1969).
[CrossRef]

Other (1)

B. L. Landrum, L. A. Jeffreys, in Proceedings of the Symposium on Information Displays and Recording, Wright-Patterson AFB, 8April1969.

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Figures (5)

Fig. 1
Fig. 1

A sixty-four-element electron beam scanner with Gray-scale coded dynodes.

Fig. 2
Fig. 2

(a) The retardation matrix R13(3); (b) retardation matrix after addition of the checkerboard filter of part c; (c) practical dynode configuration for a checkerboard filter.

Fig. 3
Fig. 3

System of axes used for a general description of the evolution of the retardation matrix as the scan proceeds.

Fig. 4
Fig. 4

Theoretical contrast improvement in a sixty-four-element electron beam scanner. (a) Test patterns; (b) no filter; (c) with checkerboard filter.

Fig. 5
Fig. 5

Conceptual diagram of the Gray-scale mask (0–4), the modified checkerboard filter (a), and the resulting equal-width channels (b).

Equations (6)

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R 11 ( 1 ) = ( 0 1 1 2 ) .
i L ( n ) / 2 = 2 n 1 and j 2 n 1 , r i j ( n ) = r i j ( n 1 ) .
i 2 n 1 and j 2 n 1 + 1 , τ i j ( n ) = r i , L ( n ) + 1 j ( n 1 ) + 1.
i 2 n 1 + 1 and j 2 n 1 , τ i j ( n ) = r L ( n ) + 1 i , j ( n 1 ) + 1.
i 2 n 1 + 1 and j 2 n 1 + 1 , τ i j ( n ) = r L ( n ) + 1 i , L ( n ) + 1 j ( n 1 ) + 2.
R i j ( n ) = H 4 H 1 H 2 H 1 V 4 V 1 V 2 V 1 R 11 ( n ) ,

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