Abstract

The effect of simulated Nimbus spacecraft orbital (1100 km, circular, and polar) radiation on wide-bandpass glass filters, narrow-bandpass thin-film interference filters, and several fused silicas was determined by transmittance measurements over the 200–3400-nm wavelength region. No changes were observed in the filters, which were shielded with fused silica during irradiation, after exposure to a 1-yr equivalent orbital dose of electrons, nor were changes observed in the fused silicas after the same electron exposure plus a 1-yr equivalent dose of protons. Exposure to a 12-yr equivalent dose of solar uv radiation, however, caused a significant degradation in the transmittance of two uv-transmitting interference filters but had no effect on two colored glass filters that transmitted in the visible and near-ir regions. As a result of the uv exposure, the fused silicas exhibited losses of several percent over the 200–300-nm wavelength region.

© 1972 Optical Society of America

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References

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  1. V. Linnenbom, Naval Research Lab. Rep. 5828 (1962).
  2. D. Heath, P. Sacher, Appl. Opt. 5, 937 (1966).
    [CrossRef] [PubMed]

1966

Heath, D.

Linnenbom, V.

V. Linnenbom, Naval Research Lab. Rep. 5828 (1962).

Sacher, P.

Appl. Opt.

Other

V. Linnenbom, Naval Research Lab. Rep. 5828 (1962).

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Figures (14)

Fig. 1
Fig. 1

Electron and proton fluxes encountered in the Nimbus orbit.

Fig. 2
Fig. 2

Transmittance of Dynasil-1000 before and after uv irradiation at 2.0 UVSC for 1100 EUVSH.

Fig. 3
Fig. 3

Transmittance of Dynasil-1000 before and after irradiation by electrons of energies 0.3 MeV, 0.5 MeV, 1.0 MeV, and 1.5 MeV to a total flux of 2.7 × 1013 electrons/cm2, plus protons of energies 0.5 MeV, 1.5 MeV, and 2.0 MeV to a total flux of 3.9 × 1011 protons/cm2, plus uv radiation at 2.0 UVSC for 1100 EUVSH.

Fig. 4
Fig. 4

Transmittance of Suprasil-W before and after irradiation by electrons of 1.0-MeV energy to a total flux of 1.0 × 1013 electrons/cm2 and after irradiation by electrons of 1.0-MeV energy to a total flux of 1.0 × 1014 electrons/cm2.

Fig. 5
Fig. 5

Transmittance of Suprasil-W before and after irradiation by electrons of 1.5-MeV energy to a total flux of 1.0 × 1014 electrons/cm2.

Fig. 6
Fig. 6

Transmittance of Suprasil-W before and after uv irradiation at 3.5 UVSC for 550, 1060, and 1940 EUVSH.

Fig. 7
Fig. 7

Transmittance of Infrasil II before and after uv irradiation at 3.5 UVSC for 530, 1068, and 1750 EUVSH.

Fig. 8
Fig. 8

Transmittance of Corning 7940 before and after uv irradiation at 2.0 UVSC for 1100 EUVSH.

Fig. 9
Fig. 9

Transmittance of Corning 7940 before and after uv irradiation at 3.5 UVSC for 600 and 875 EUVSH.

Fig. 10
Fig. 10

Transmittance of interference filter 1 (250–300 nm) before and after irradiation by electrons of energies 0.3 MeV, 0.5 MeV, 1.0 MeV, and 1.5 MeV to a total flux of 2.7 × 1013 electrons/cm2 and after irradiation by the above electrons plus uv radiation at 2.0 UVSC for 1100 EUVSH. Measurements were also made 170 h after the uv irradiation. The filter was shielded from direct radiation by 3.1 mm of fused silica.

Fig. 11
Fig. 11

Transmittance of interference filter 4 (350–450 nm) before and after irradiation by electrons of energies 0.3 MeV, 0.5 MeV, 1.0 MeV, and 1.5 MeV to a total flux of 2.7 × 1013 electrons/cm2 and after irradiation by the above electrons plus uv radiation at 2.0 UVSC for 1100 EUVSH. Measurements were also made 170 h after the uv irradiation. The filter was shielded from direct radiation by 3.1 mm of fused silica.

Fig. 12
Fig. 12

Transmittance of interference filter 5 (400–500 nm) before and after irradiation by electrons of energies 0.3 MeV, 0.5 MeV, 1.0 MeV, and 1.5 MeV to a total flux of 2.7 × 1013 electrons/cm2 and after irradiation by the above electrons plus uv radiation at 2.0 UVSC for 1100 EUVSH. The filter was shielded from direct radiation by 3.1 mm of fused silica.

Fig. 13
Fig. 13

Transmittance of interference filter 7 (700-nm cuton) before and after irradiation by electrons of energies 0.3 MeV, 0.5 MeV, 1.0 MeV, and 1.5 MeV to a total flux of 2.7 × 1013 electrons/cm2 and after irradiation by the above electrons plus uv radiation at 2.0 UVSC for 1100 EUVSH. The filter was shielded from the direct radiation by 3.1 mm of fused silica.

Fig. 14
Fig. 14

Comparison of the effect of uv irradiation (at 3.5 UVSC) on the transmittance of fused-silica shielding material.

Tables (2)

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Table I Electron Irradiation Test Levels

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Table II Proton Irradiation Test Levels

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