Abstract

The reflectance R and transmittance T of thin absorbing films deposited on a transparent substrate are calculated for normal and oblique incidence, s and p polarization, and different film thicknesses The results are presented as contours of constant R and T on the ñ plane, where ñ is the complex refractive index. The conditions for sensitive dependence of measured quantities on ñ are examined. A computer-based method of finding ñ from chosen combinations of measured R or T values is described. Oblique incidence measurements on thin films can give accurate results in some regions where other methods may be less sensitive. Accurate film-thickness value can be obtained from the optical measurements.

© 1972 Optical Society of America

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Determination of thickness and optical constants of thin films from photometric and ellipsometric measurements

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