Abstract

It has been found that vacuum-deposited films of CsI, AgCl, TlBr, and TlCl are useful as antireflection coatings for silicon over a broad spectral range in the infrared. Measurements performed on a plane-parallel silicon plate coated with various thicknesses of the above materials yield transmittance values ranging from 99% at λ = 2.9 μm to 88% at λ = 27 μm. Experimental details of the coating process and properties of the coatings are discussed.

© 1971 Optical Society of America

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