Glass-batch composition monitoring by laser-induced breakdown spectroscopy

Bansi Lal; Fang-Yu Yueh; Jagdish P. Singh

doi:10.1364/AO.44.003668

Applied Optics
Vol. 44,
Issue 18,
pp. 3668-3674
(2005)
•https://doi.org/10.1364/AO.44.003668

Glass-batch composition monitoring by laser-induced breakdown spectroscopy

Bansi Lal, Fang-Yu Yueh, and Jagdish P. Singh

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Bansi Lal, Fang-Yu Yueh, and Jagdish P. Singh, "Glass-batch composition monitoring by laser-induced breakdown spectroscopy," Appl. Opt. 44, 3668-3674 (2005)

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Abstract

Laser-induced breakdown spectroscopy is an almost ideal technique for the in situ monitoring of the composition of a glass batch before it enters the glass-melting furnace, saving a significant amount of energy by the optimization of the furnace parameters for a particular composition of the glass batch. We investigate this application of laser-induced breakdown spectroscopy by determining the elemental composition of the glass batch used (i) as a surrogate for radioactive glass waste and (ii) to manufacture the most common type of flat glass. The surrogate glass-batch and flat-glass calibration curves for the major constituents have been prepared using both the line intensity and the line-intensity ratio. The analytical figure of merit of the glass-batch data obtained from the two different detection systems, namely, the Czerny–Turner spectrometer with an intensified diode-array detector and the echelle spectrometer fitted with an intensified CCD camera, are compared.

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Parameter	Spectrometer

	A. SPEX 500M(24001 lines/mm grating)	B. ESA 3000 Echelle
Spectral coverage	0–750 nm	200–780 nm
Simultaneous spectral range	∼20 nm	580 nm
Spectral resolution (λ/Δλ)	20,000@200 nm	40,000
	78,000@780 nm
Linear dispersion	0.0195 nm/pixel	0.005 nm/pixel@200 nm
		0.019 nm/pixel@780 nm

Element	System A			System B

	390 ± 20 nm	250 ± 20 nm	336 ± 20 nm	200–780 nm
B		249.677 nm		249.773
Fe		250.113 nm	349.057 nm	404.581
Si	390.552 nm	250.69 nm		288.158
Ni			345.847 nm	341.476
			349.296 nm
Na			330.237 nm	589.899
Ca	395.705 nm		336.192 nm	393.366
Al	394.401 nm			308.215

Element	System A			System B

	Analyte Line (nm)	RA	RSTD	Analyte Line (nm)	RA	RSTD
Si	390.5	0.017	0.047	288.158	0.027	0.085
Fe	387.8	0.029	0.046	Fe 371.99/Si 288.158	0.053	0.039
Ni	345.8	^a	0.046	Ni 341.48/Si 288.158	0.12	0.039
Al	394.4	0.005	0.045	Al 308.22/Si 288.158	0.033	0.021
Ca	336.1	0.019	0.046	Ca 393.37/Si 288.158	0.077	0.049
B	B 249.6/Fe 250.1	0.10	0.045	B 249.77/Si 288.158	0.087	0.061

Parameter	Spectrometer

	A. SPEX 500M(24001 lines/mm grating)	B. ESA 3000 Echelle
Spectral coverage	0–750 nm	200–780 nm
Simultaneous spectral range	∼20 nm	580 nm
Spectral resolution (λ/Δλ)	20,000@200 nm	40,000
	78,000@780 nm
Linear dispersion	0.0195 nm/pixel	0.005 nm/pixel@200 nm
		0.019 nm/pixel@780 nm

Element	System A			System B

	390 ± 20 nm	250 ± 20 nm	336 ± 20 nm	200–780 nm
B		249.677 nm		249.773
Fe		250.113 nm	349.057 nm	404.581
Si	390.552 nm	250.69 nm		288.158
Ni			345.847 nm	341.476
			349.296 nm
Na			330.237 nm	589.899
Ca	395.705 nm		336.192 nm	393.366
Al	394.401 nm			308.215

Abstract

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Equations (4)

Applied Optics