This issue of Applied Optics features 36 papers on topics related to particle sizing by optical methods. The contributions to this special issue derive primarily, though not exclusively, from papers presented at the Second International Congress on Optical Particle Sizing held in Tempe, Arizona, on 5–9 March 1990. The congress was the second in what we hope will be a continuing series of international meetings, held at 3-year intervals, on topics related to particle-size measurements by optical techniques. The 1990 Congress built on the successful First International Congress held in Rouen, France, in 1987. A third Congress is planned for 1993 in Yokohama, Japan.
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