Abstract

A procedure is developed to retrieve defect densities of optical coatings and surfaces from spatiotemporally resolved optical-laser induced damage (STEREO-LID) measurements. In STEREO-LID, the temporal onset and location of nanosecond laser damage initiation is measured for each excitation event. The power of STEREO-LID relative to traditional damage tests resulting in damage probabilities is characterized with LID data from Monte Carlo simulations.

© 2015 Optical Society of America

Spatio-TEmporally REsolved Optical Laser Induced Damage (STEREO LID) technique for material characterization

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