Equations are presented for the third-order Seidel aberrations of the Gabor superlens (GSL) as a function of microtelescope channel position within the aperture array. To reveal the origin and form of increasing aberration with channel height, Seidel coefficients are derived as a function of the accumulating pitch difference between the lens arrays and the aberrations present in the centered channel. Two- and three-element Gabor lenses are investigated and their aberrations are expressed as a function of first-order design parameters. The derived theory is then compared to a real ray trace simulation to demonstrate the accuracy of third-order aberration theory to predict GSL image quality.
© 2014 Optical Society of America
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