Applied Optics presents three special issues to end its retrospective of Applied Optics’ 50 years. The special issues are interference, interferometry, and phase; imaging, optical processing, and telecommunications; and polarization and scattering. The issues, which contain 19 commemorative reviews from some of the journal’s luminaries, are summarized.
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Appl. Opt. 26(20) 4351-4360 (1987)
Alexei Kouzoubov, Michael J. Brennan, and John C. Thomas
Appl. Opt. 37(18) 3873-3885 (1998)
Yao Li, Jun Tanida, Frank Tooley, and Kelvin Wagner
Appl. Opt. 35(8) 1177-1179 (1996)