Y. Qiu, B. Chang, Y. Qian, R. Fu, Y. Gao, and T. Si, “Model for the brightness uniformity of fluorescence screen of image intensifier,” Proc. SPIE 6279, 62792F1–62792F6 (2007).

L. Bai, W. Qian, Y. Zhang, and B. Zhang, “Analysis and study on the stadia of low light level imaging system,” Proc. SPIE 5633, 460–469 (2005).

[CrossRef]

Y. Qian, B. Chang, M. Tong, and L. Liu, “Frequency spectrum measurement of noise of image intensifiers,” Proc. SPIE 4796, 100–106 (2003).

[CrossRef]

C. Clamberlini, G. Longobardi, P. L. Ramazza, and S. Residori, “New approach to noise factor measurement of imaging devices,” Opt. Eng. 33, 845–849 (1994).

[CrossRef]

W. Yayi and T. Zhaomin, “Theoretical analysis of MCP noise factor,” J. Electron. 15, 655–658 (1993).

S. K. Kulov, N. B. Leonov, M. P. Polyanskii, and A. M. Tyutikov, “Accuracy of measuring the noise factor of microchannel plates,” Sov. J. Opt. Technol. 59, 285–287 (1992).

K. G. McCammon, K. G. Hagans, and A. K. Hankla, “Noise performance of microchannel plate imaging systems,” Proc. SPIE 1346, 398–403 (1991).

[CrossRef]

B. N. Laprade, S. T. Reinhart, and M. Wheeler, “Low-noise-figure microchannel plate optimized for Gen III image intensification systems,” Proc. SPIE 1243, 162–172 (1990).

[CrossRef]

N. B. Leonov, M. N. Toiseva, A. M. Tyutikov, and N. A. Shishatskii, “Measurement of the noise of microchannel plates,” Sov. J. Opt. Technol. 48, 740–744 (1981).

L. Bai, W. Qian, Y. Zhang, and B. Zhang, “Analysis and study on the stadia of low light level imaging system,” Proc. SPIE 5633, 460–469 (2005).

[CrossRef]

Y. Qiu, B. Chang, Y. Qian, R. Fu, Y. Gao, and T. Si, “Model for the brightness uniformity of fluorescence screen of image intensifier,” Proc. SPIE 6279, 62792F1–62792F6 (2007).

Y. Qian, B. Chang, M. Tong, and L. Liu, “Frequency spectrum measurement of noise of image intensifiers,” Proc. SPIE 4796, 100–106 (2003).

[CrossRef]

C. Clamberlini, G. Longobardi, P. L. Ramazza, and S. Residori, “New approach to noise factor measurement of imaging devices,” Opt. Eng. 33, 845–849 (1994).

[CrossRef]

Y. Qiu, B. Chang, Y. Qian, R. Fu, Y. Gao, and T. Si, “Model for the brightness uniformity of fluorescence screen of image intensifier,” Proc. SPIE 6279, 62792F1–62792F6 (2007).

Y. Qiu, B. Chang, Y. Qian, R. Fu, Y. Gao, and T. Si, “Model for the brightness uniformity of fluorescence screen of image intensifier,” Proc. SPIE 6279, 62792F1–62792F6 (2007).

K. G. McCammon, K. G. Hagans, and A. K. Hankla, “Noise performance of microchannel plate imaging systems,” Proc. SPIE 1346, 398–403 (1991).

[CrossRef]

K. G. McCammon, K. G. Hagans, and A. K. Hankla, “Noise performance of microchannel plate imaging systems,” Proc. SPIE 1346, 398–403 (1991).

[CrossRef]

S. K. Kulov, N. B. Leonov, M. P. Polyanskii, and A. M. Tyutikov, “Accuracy of measuring the noise factor of microchannel plates,” Sov. J. Opt. Technol. 59, 285–287 (1992).

B. N. Laprade, S. T. Reinhart, and M. Wheeler, “Low-noise-figure microchannel plate optimized for Gen III image intensification systems,” Proc. SPIE 1243, 162–172 (1990).

[CrossRef]

S. K. Kulov, N. B. Leonov, M. P. Polyanskii, and A. M. Tyutikov, “Accuracy of measuring the noise factor of microchannel plates,” Sov. J. Opt. Technol. 59, 285–287 (1992).

N. B. Leonov, M. N. Toiseva, A. M. Tyutikov, and N. A. Shishatskii, “Measurement of the noise of microchannel plates,” Sov. J. Opt. Technol. 48, 740–744 (1981).

Y. Qian, B. Chang, M. Tong, and L. Liu, “Frequency spectrum measurement of noise of image intensifiers,” Proc. SPIE 4796, 100–106 (2003).

[CrossRef]

C. Clamberlini, G. Longobardi, P. L. Ramazza, and S. Residori, “New approach to noise factor measurement of imaging devices,” Opt. Eng. 33, 845–849 (1994).

[CrossRef]

K. G. McCammon, K. G. Hagans, and A. K. Hankla, “Noise performance of microchannel plate imaging systems,” Proc. SPIE 1346, 398–403 (1991).

[CrossRef]

S. K. Kulov, N. B. Leonov, M. P. Polyanskii, and A. M. Tyutikov, “Accuracy of measuring the noise factor of microchannel plates,” Sov. J. Opt. Technol. 59, 285–287 (1992).

L. Bai, W. Qian, Y. Zhang, and B. Zhang, “Analysis and study on the stadia of low light level imaging system,” Proc. SPIE 5633, 460–469 (2005).

[CrossRef]

Y. Qiu, B. Chang, Y. Qian, R. Fu, Y. Gao, and T. Si, “Model for the brightness uniformity of fluorescence screen of image intensifier,” Proc. SPIE 6279, 62792F1–62792F6 (2007).

Y. Qian, B. Chang, M. Tong, and L. Liu, “Frequency spectrum measurement of noise of image intensifiers,” Proc. SPIE 4796, 100–106 (2003).

[CrossRef]

Y. Qiu, B. Chang, Y. Qian, R. Fu, Y. Gao, and T. Si, “Model for the brightness uniformity of fluorescence screen of image intensifier,” Proc. SPIE 6279, 62792F1–62792F6 (2007).

C. Clamberlini, G. Longobardi, P. L. Ramazza, and S. Residori, “New approach to noise factor measurement of imaging devices,” Opt. Eng. 33, 845–849 (1994).

[CrossRef]

B. N. Laprade, S. T. Reinhart, and M. Wheeler, “Low-noise-figure microchannel plate optimized for Gen III image intensification systems,” Proc. SPIE 1243, 162–172 (1990).

[CrossRef]

C. Clamberlini, G. Longobardi, P. L. Ramazza, and S. Residori, “New approach to noise factor measurement of imaging devices,” Opt. Eng. 33, 845–849 (1994).

[CrossRef]

N. B. Leonov, M. N. Toiseva, A. M. Tyutikov, and N. A. Shishatskii, “Measurement of the noise of microchannel plates,” Sov. J. Opt. Technol. 48, 740–744 (1981).

Y. Qiu, B. Chang, Y. Qian, R. Fu, Y. Gao, and T. Si, “Model for the brightness uniformity of fluorescence screen of image intensifier,” Proc. SPIE 6279, 62792F1–62792F6 (2007).

N. B. Leonov, M. N. Toiseva, A. M. Tyutikov, and N. A. Shishatskii, “Measurement of the noise of microchannel plates,” Sov. J. Opt. Technol. 48, 740–744 (1981).

Y. Qian, B. Chang, M. Tong, and L. Liu, “Frequency spectrum measurement of noise of image intensifiers,” Proc. SPIE 4796, 100–106 (2003).

[CrossRef]

S. K. Kulov, N. B. Leonov, M. P. Polyanskii, and A. M. Tyutikov, “Accuracy of measuring the noise factor of microchannel plates,” Sov. J. Opt. Technol. 59, 285–287 (1992).

N. B. Leonov, M. N. Toiseva, A. M. Tyutikov, and N. A. Shishatskii, “Measurement of the noise of microchannel plates,” Sov. J. Opt. Technol. 48, 740–744 (1981).

B. N. Laprade, S. T. Reinhart, and M. Wheeler, “Low-noise-figure microchannel plate optimized for Gen III image intensification systems,” Proc. SPIE 1243, 162–172 (1990).

[CrossRef]

W. Yayi and T. Zhaomin, “Theoretical analysis of MCP noise factor,” J. Electron. 15, 655–658 (1993).

L. Bai, W. Qian, Y. Zhang, and B. Zhang, “Analysis and study on the stadia of low light level imaging system,” Proc. SPIE 5633, 460–469 (2005).

[CrossRef]

L. Bai, W. Qian, Y. Zhang, and B. Zhang, “Analysis and study on the stadia of low light level imaging system,” Proc. SPIE 5633, 460–469 (2005).

[CrossRef]

W. Yayi and T. Zhaomin, “Theoretical analysis of MCP noise factor,” J. Electron. 15, 655–658 (1993).

K. G. McCammon, K. G. Hagans, and A. K. Hankla, “Noise performance of microchannel plate imaging systems,” Proc. SPIE 1346, 398–403 (1991).

[CrossRef]

W. Yayi and T. Zhaomin, “Theoretical analysis of MCP noise factor,” J. Electron. 15, 655–658 (1993).

C. Clamberlini, G. Longobardi, P. L. Ramazza, and S. Residori, “New approach to noise factor measurement of imaging devices,” Opt. Eng. 33, 845–849 (1994).

[CrossRef]

L. Bai, W. Qian, Y. Zhang, and B. Zhang, “Analysis and study on the stadia of low light level imaging system,” Proc. SPIE 5633, 460–469 (2005).

[CrossRef]

Y. Qian, B. Chang, M. Tong, and L. Liu, “Frequency spectrum measurement of noise of image intensifiers,” Proc. SPIE 4796, 100–106 (2003).

[CrossRef]

Y. Qiu, B. Chang, Y. Qian, R. Fu, Y. Gao, and T. Si, “Model for the brightness uniformity of fluorescence screen of image intensifier,” Proc. SPIE 6279, 62792F1–62792F6 (2007).

B. N. Laprade, S. T. Reinhart, and M. Wheeler, “Low-noise-figure microchannel plate optimized for Gen III image intensification systems,” Proc. SPIE 1243, 162–172 (1990).

[CrossRef]

N. B. Leonov, M. N. Toiseva, A. M. Tyutikov, and N. A. Shishatskii, “Measurement of the noise of microchannel plates,” Sov. J. Opt. Technol. 48, 740–744 (1981).

S. K. Kulov, N. B. Leonov, M. P. Polyanskii, and A. M. Tyutikov, “Accuracy of measuring the noise factor of microchannel plates,” Sov. J. Opt. Technol. 59, 285–287 (1992).