Abstract

A new method for noise power factor determination of microchannel plates (MCPs) is described in this paper. The new measuring condition and specific measuring instrument are reported. The system consists of a vacuum chamber, an electron gun, a high-voltage supply, an imaging luminance meter, control units, a signal processing circuit, an A/D converter, a D/A converter, a communication unit, an industrial computer, and measurement software. This measuring method fills a void in measuring technology for the noise factor of MCPs, and it can make a scientific assessment of MCP noise characteristics and provide theoretical direction and technology support for the research and development of high-performance low light level (LLL) devices.

© 2012 Optical Society of America

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