Abstract

Applications of computational manufacturing experiments (CMEs) for selection of the most manufacturable designs among a variety of different design solutions are demonstrated. We compare design solutions with respect to estimations of their production yields. Computational experiments are performed using two simulation software tools. In the course of CMEs, we take into account all major factors causing errors in our deposition process. Real deposition experiments are in agreement with CMEs; the most manufacturable design exhibits better target performances compared to other designs.

© 2012 Optical Society of America

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]

2012 (3)

2011 (6)

2010 (2)

K. Friedrich, S. Wilbrandt, O. Stenzel, N. Kaiser, and K. Hoffmann, “Computational manufacturing of optical interference coatings: method, simulation results, and comparison with experiment,” Appl. Opt. 49, 3150–3162 (2010).
[CrossRef]

O. Stenzel, S. Wilbrandt, and N. Kaiser, “All-oxide broadband antireflection coatings by plasma ion assisted deposition: design, simulation, manufacturing and re-optimization,” Opt. Express 18, 8704–8708 (2010).
[CrossRef]

2008 (5)

O. Stenzel, S. Wilbrandt, D. Fasold, and N. Kaiser, “A hybrid in situ monitoring strategy for optical coating deposition: application to the preparation of chirped dielectric mirrors,” J. Opt. A 10, 085305 (2008).
[CrossRef]

A. Zoeller, M. Boos, H. Hagedorn, and B. Romanov, “Computer simulation of coating processes with monochromatic monitoring,” Proc. SPIE 7101, 71010G (2008).
[CrossRef]

A. Tikhonravov, M. Trubetskov, and I. Kasahara, “Achievements and challenges in the design and production of high quality optical coatings,” IEICE Trans. Electron. E91-C, 1622–1629 (2008).
[CrossRef]

D. Ristau, H. Ehlers, S. Schlichting, and M. Lappschies, “State of art in deterministic production of optical thin films,” Proc. SPIE 7101, 71010C (2008).
[CrossRef]

S. Wilbrandt, O. Stenzel, N. Kaiser, M. K. Trubetskov, and A. V. Tikhonravov, “In situ optical characterization and re-engineering of interference coatings,” Appl. Opt. 47, C49–C54 (2008).
[CrossRef]

2007 (3)

2006 (3)

2005 (1)

2004 (2)

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, and M. A. Kokarev, “Key role of the coating total optical thickness in solving design problems,” Proc. SPIE 5250, 312–321 (2004).
[CrossRef]

A. V. Tikhonravov and M. K. Trubetskov, “On-line characterization and reoptimization of optical coatings,” Proc. SPIE 5250, 406–413 (2004).
[CrossRef]

2003 (1)

J. Kruschwitz, “Software tools speed optical thin-film design,” Laser Focus World 39, 157–166 (2003).

1996 (1)

1992 (1)

1981 (1)

1978 (1)

Amotchkina, T. V.

T. V. Amotchkina, S. Schlichting, H. Ehlers, M. K. Trubetskov, A. V. Tikhonravov, and D. Ristau, “Computational manufacturing as a key element in design-production chain for modern multilayer coatings,” Appl. Opt. 51, 7604–7615 (2012).
[CrossRef]

A. V. Tikhonravov, T. V. Amotchkina, M. K. Trubetskov, R. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak, “Optical characterization and reverse engineering based on multiangle spectroscopy,” Appl. Opt. 51, 245–254 (2012).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, and V. Pervak, “Estimations of production yields for choosing of a practically optimal optical coating design,” Appl. Opt. 50, C141–C147 (2011).
[CrossRef]

T. V. Amotchkina, M. K. Trubetskov, V. Pervak, and A. V. Tikhonravov, “Design, production and reverse engineering of two-octave antireflection coatings,” Appl. Opt. 50, 6468–6475 (2011).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, G. DeBell, V. Pervak, A. K. Sytchkova, M. L. Grilli, and D. Ristau, “Optical parameters of oxide films typically used in optical coating production,” Appl. Opt. 50, C75–C85 (2011).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Investigation of the error self-compensation effect associated with broadband optical monitoring,” Appl. Opt. 50, C111–C116 (2011).
[CrossRef]

T. V. Amotchkina, M. K. Trubetskov, V. Pervak, S. Schlichting, H. Ehlers, D. Ristau, and A. V. Tikhonravov, “Comparison of algorithms used for optical characterization of multilayer optical coatings,” Appl. Opt. 50, 3389–3395 (2011).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Investigation of the effect of accumulation of thickness errors in optical coating production using broadband optical monitoring,” Appl. Opt. 45, 7026–7034 (2006).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, and M. A. Kokarev, “Key role of the coating total optical thickness in solving design problems,” Proc. SPIE 5250, 312–321 (2004).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Computational manufacturing experiments for choosing optimal design and monitoring strategy,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuA5.

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “On the reliability of computational estimations used for choosing the most manufacturable design,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuA3.

Badoil, B.

Boos, M.

A. Zoeller, M. Boos, H. Hagedorn, and B. Romanov, “Computer simulation of coating processes with monochromatic monitoring,” Proc. SPIE 7101, 71010G (2008).
[CrossRef]

Cathelinaud, M.

DeBell, G.

DeBell, G. W.

Dobrowolski, J. A.

Ehlers, H.

Fasold, D.

O. Stenzel, S. Wilbrandt, D. Fasold, and N. Kaiser, “A hybrid in situ monitoring strategy for optical coating deposition: application to the preparation of chirped dielectric mirrors,” J. Opt. A 10, 085305 (2008).
[CrossRef]

Fornier, A.

Francis, R.

Friedrich, K.

Furman, S.

S. Furman and A. V. Tikhonravov, Basics of Optics of Multilayer Systems (Edition Frontieres, 1992).

Grilli, M. L.

Gross, T.

Hagedorn, H.

A. Zoeller, M. Boos, H. Hagedorn, and B. Romanov, “Computer simulation of coating processes with monochromatic monitoring,” Proc. SPIE 7101, 71010G (2008).
[CrossRef]

Hendrix, K.

Hoffmann, K.

Janicki, V.

Kaiser, N.

K. Friedrich, S. Wilbrandt, O. Stenzel, N. Kaiser, and K. Hoffmann, “Computational manufacturing of optical interference coatings: method, simulation results, and comparison with experiment,” Appl. Opt. 49, 3150–3162 (2010).
[CrossRef]

O. Stenzel, S. Wilbrandt, and N. Kaiser, “All-oxide broadband antireflection coatings by plasma ion assisted deposition: design, simulation, manufacturing and re-optimization,” Opt. Express 18, 8704–8708 (2010).
[CrossRef]

O. Stenzel, S. Wilbrandt, D. Fasold, and N. Kaiser, “A hybrid in situ monitoring strategy for optical coating deposition: application to the preparation of chirped dielectric mirrors,” J. Opt. A 10, 085305 (2008).
[CrossRef]

S. Wilbrandt, O. Stenzel, N. Kaiser, M. K. Trubetskov, and A. V. Tikhonravov, “In situ optical characterization and re-engineering of interference coatings,” Appl. Opt. 47, C49–C54 (2008).
[CrossRef]

Kasahara, I.

A. Tikhonravov, M. Trubetskov, and I. Kasahara, “Achievements and challenges in the design and production of high quality optical coatings,” IEICE Trans. Electron. E91-C, 1622–1629 (2008).
[CrossRef]

Kokarev, M. A.

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, and M. A. Kokarev, “Key role of the coating total optical thickness in solving design problems,” Proc. SPIE 5250, 312–321 (2004).
[CrossRef]

Kruschwitz, J.

J. Kruschwitz, “Software tools speed optical thin-film design,” Laser Focus World 39, 157–166 (2003).

Lappschies, M.

D. Ristau, H. Ehlers, S. Schlichting, and M. Lappschies, “State of art in deterministic production of optical thin films,” Proc. SPIE 7101, 71010C (2008).
[CrossRef]

D. Ristau, H. Ehlers, T. Gross, and M. Lappschies, “Optical broadband monitoring of conventional and ion processes,” Appl. Opt. 45, 1495–1501 (2006).
[CrossRef]

Lemarchand, F.

Lequime, M.

Macleod, H.

Pelletier, E.

Pervak, V.

Ristau, D.

Romanov, B.

A. Zoeller, M. Boos, H. Hagedorn, and B. Romanov, “Computer simulation of coating processes with monochromatic monitoring,” Proc. SPIE 7101, 71010G (2008).
[CrossRef]

Sancho-Parramon, J.

Schlichting, S.

T. V. Amotchkina, S. Schlichting, H. Ehlers, M. K. Trubetskov, A. V. Tikhonravov, and D. Ristau, “Computational manufacturing as a key element in design-production chain for modern multilayer coatings,” Appl. Opt. 51, 7604–7615 (2012).
[CrossRef]

T. V. Amotchkina, M. K. Trubetskov, V. Pervak, S. Schlichting, H. Ehlers, D. Ristau, and A. V. Tikhonravov, “Comparison of algorithms used for optical characterization of multilayer optical coatings,” Appl. Opt. 50, 3389–3395 (2011).
[CrossRef]

D. Ristau, H. Ehlers, S. Schlichting, and M. Lappschies, “State of art in deterministic production of optical thin films,” Proc. SPIE 7101, 71010C (2008).
[CrossRef]

H. Ehlers, S. Schlichting, C. Schmitz, and D. Ristau, “Hybrid process control for precision optics enhanced by computational manufacturing,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuC6.

Schmitz, C.

H. Ehlers, S. Schlichting, C. Schmitz, and D. Ristau, “Hybrid process control for precision optics enhanced by computational manufacturing,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuC6.

Stenzel, O.

K. Friedrich, S. Wilbrandt, O. Stenzel, N. Kaiser, and K. Hoffmann, “Computational manufacturing of optical interference coatings: method, simulation results, and comparison with experiment,” Appl. Opt. 49, 3150–3162 (2010).
[CrossRef]

O. Stenzel, S. Wilbrandt, and N. Kaiser, “All-oxide broadband antireflection coatings by plasma ion assisted deposition: design, simulation, manufacturing and re-optimization,” Opt. Express 18, 8704–8708 (2010).
[CrossRef]

O. Stenzel, S. Wilbrandt, D. Fasold, and N. Kaiser, “A hybrid in situ monitoring strategy for optical coating deposition: application to the preparation of chirped dielectric mirrors,” J. Opt. A 10, 085305 (2008).
[CrossRef]

S. Wilbrandt, O. Stenzel, N. Kaiser, M. K. Trubetskov, and A. V. Tikhonravov, “In situ optical characterization and re-engineering of interference coatings,” Appl. Opt. 47, C49–C54 (2008).
[CrossRef]

Sullivan, B. T.

Sytchkova, A. K.

Tikhonravov, A.

A. Tikhonravov, M. Trubetskov, and I. Kasahara, “Achievements and challenges in the design and production of high quality optical coatings,” IEICE Trans. Electron. E91-C, 1622–1629 (2008).
[CrossRef]

Tikhonravov, A. V.

A. V. Tikhonravov and M. K. Trubetskov, “Modern design tools and a new paradigm in optical coating design,” Appl. Opt. 51, 7319–7332 (2012).
[CrossRef]

T. V. Amotchkina, S. Schlichting, H. Ehlers, M. K. Trubetskov, A. V. Tikhonravov, and D. Ristau, “Computational manufacturing as a key element in design-production chain for modern multilayer coatings,” Appl. Opt. 51, 7604–7615 (2012).
[CrossRef]

A. V. Tikhonravov, T. V. Amotchkina, M. K. Trubetskov, R. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak, “Optical characterization and reverse engineering based on multiangle spectroscopy,” Appl. Opt. 51, 245–254 (2012).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, and V. Pervak, “Estimations of production yields for choosing of a practically optimal optical coating design,” Appl. Opt. 50, C141–C147 (2011).
[CrossRef]

T. V. Amotchkina, M. K. Trubetskov, V. Pervak, S. Schlichting, H. Ehlers, D. Ristau, and A. V. Tikhonravov, “Comparison of algorithms used for optical characterization of multilayer optical coatings,” Appl. Opt. 50, 3389–3395 (2011).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Investigation of the error self-compensation effect associated with broadband optical monitoring,” Appl. Opt. 50, C111–C116 (2011).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, G. DeBell, V. Pervak, A. K. Sytchkova, M. L. Grilli, and D. Ristau, “Optical parameters of oxide films typically used in optical coating production,” Appl. Opt. 50, C75–C85 (2011).
[CrossRef]

V. Pervak, M. K. Trubetskov, and A. V. Tikhonravov, “Robust synthesis of dispersive mirrors,” Opt. Express 19, 2371–2380 (2011).
[CrossRef]

T. V. Amotchkina, M. K. Trubetskov, V. Pervak, and A. V. Tikhonravov, “Design, production and reverse engineering of two-octave antireflection coatings,” Appl. Opt. 50, 6468–6475 (2011).
[CrossRef]

S. Wilbrandt, O. Stenzel, N. Kaiser, M. K. Trubetskov, and A. V. Tikhonravov, “In situ optical characterization and re-engineering of interference coatings,” Appl. Opt. 47, C49–C54 (2008).
[CrossRef]

A. V. Tikhonravov and M. K. Trubetskov, “Modern status and prospects of the development of methods of designing multilayer optical coatings,” J. Opt. Technol. 74, 845–850 (2007).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and G. W. DeBell, “Optical coating design approaches based on the needle optimization technique,” Appl. Opt. 46, 704–710 (2007).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Investigation of the effect of accumulation of thickness errors in optical coating production using broadband optical monitoring,” Appl. Opt. 45, 7026–7034 (2006).
[CrossRef]

A. V. Tikhonravov and M. K. Trubetskov, “Computational manufacturing as a bridge between design and production,” Appl. Opt. 44, 6877–6884 (2005).
[CrossRef]

A. V. Tikhonravov and M. K. Trubetskov, “On-line characterization and reoptimization of optical coatings,” Proc. SPIE 5250, 406–413 (2004).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, and M. A. Kokarev, “Key role of the coating total optical thickness in solving design problems,” Proc. SPIE 5250, 312–321 (2004).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and G. W. DeBell, “Application of the needle optimization technique to the design of optical coatings,” Appl. Opt. 35, 5493–5508 (1996).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Computational manufacturing experiments for choosing optimal design and monitoring strategy,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuA5.

A. V. Tikhonravov and M. K. Trubetskov, “Design opportunities for better manufacturability,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), p. WA2.

A. V. Tikhonravov and M. K. Trubetskov, OptiLayer Thin Film Software, http://www.optilayer.com .

S. Furman and A. V. Tikhonravov, Basics of Optics of Multilayer Systems (Edition Frontieres, 1992).

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “On the reliability of computational estimations used for choosing the most manufacturable design,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuA3.

Tilsch, M.

Trubetskov, M.

A. Tikhonravov, M. Trubetskov, and I. Kasahara, “Achievements and challenges in the design and production of high quality optical coatings,” IEICE Trans. Electron. E91-C, 1622–1629 (2008).
[CrossRef]

Trubetskov, M. K.

A. V. Tikhonravov and M. K. Trubetskov, “Modern design tools and a new paradigm in optical coating design,” Appl. Opt. 51, 7319–7332 (2012).
[CrossRef]

T. V. Amotchkina, S. Schlichting, H. Ehlers, M. K. Trubetskov, A. V. Tikhonravov, and D. Ristau, “Computational manufacturing as a key element in design-production chain for modern multilayer coatings,” Appl. Opt. 51, 7604–7615 (2012).
[CrossRef]

A. V. Tikhonravov, T. V. Amotchkina, M. K. Trubetskov, R. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak, “Optical characterization and reverse engineering based on multiangle spectroscopy,” Appl. Opt. 51, 245–254 (2012).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, and V. Pervak, “Estimations of production yields for choosing of a practically optimal optical coating design,” Appl. Opt. 50, C141–C147 (2011).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Investigation of the error self-compensation effect associated with broadband optical monitoring,” Appl. Opt. 50, C111–C116 (2011).
[CrossRef]

T. V. Amotchkina, M. K. Trubetskov, V. Pervak, S. Schlichting, H. Ehlers, D. Ristau, and A. V. Tikhonravov, “Comparison of algorithms used for optical characterization of multilayer optical coatings,” Appl. Opt. 50, 3389–3395 (2011).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, G. DeBell, V. Pervak, A. K. Sytchkova, M. L. Grilli, and D. Ristau, “Optical parameters of oxide films typically used in optical coating production,” Appl. Opt. 50, C75–C85 (2011).
[CrossRef]

V. Pervak, M. K. Trubetskov, and A. V. Tikhonravov, “Robust synthesis of dispersive mirrors,” Opt. Express 19, 2371–2380 (2011).
[CrossRef]

T. V. Amotchkina, M. K. Trubetskov, V. Pervak, and A. V. Tikhonravov, “Design, production and reverse engineering of two-octave antireflection coatings,” Appl. Opt. 50, 6468–6475 (2011).
[CrossRef]

S. Wilbrandt, O. Stenzel, N. Kaiser, M. K. Trubetskov, and A. V. Tikhonravov, “In situ optical characterization and re-engineering of interference coatings,” Appl. Opt. 47, C49–C54 (2008).
[CrossRef]

A. V. Tikhonravov and M. K. Trubetskov, “Modern status and prospects of the development of methods of designing multilayer optical coatings,” J. Opt. Technol. 74, 845–850 (2007).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and G. W. DeBell, “Optical coating design approaches based on the needle optimization technique,” Appl. Opt. 46, 704–710 (2007).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Investigation of the effect of accumulation of thickness errors in optical coating production using broadband optical monitoring,” Appl. Opt. 45, 7026–7034 (2006).
[CrossRef]

A. V. Tikhonravov and M. K. Trubetskov, “Computational manufacturing as a bridge between design and production,” Appl. Opt. 44, 6877–6884 (2005).
[CrossRef]

A. V. Tikhonravov and M. K. Trubetskov, “On-line characterization and reoptimization of optical coatings,” Proc. SPIE 5250, 406–413 (2004).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, and M. A. Kokarev, “Key role of the coating total optical thickness in solving design problems,” Proc. SPIE 5250, 312–321 (2004).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and G. W. DeBell, “Application of the needle optimization technique to the design of optical coatings,” Appl. Opt. 35, 5493–5508 (1996).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Computational manufacturing experiments for choosing optimal design and monitoring strategy,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuA5.

A. V. Tikhonravov and M. K. Trubetskov, OptiLayer Thin Film Software, http://www.optilayer.com .

A. V. Tikhonravov and M. K. Trubetskov, “Design opportunities for better manufacturability,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), p. WA2.

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “On the reliability of computational estimations used for choosing the most manufacturable design,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuA3.

Verly, P.

Vidal, B.

Wilbrandt, S.

K. Friedrich, S. Wilbrandt, O. Stenzel, N. Kaiser, and K. Hoffmann, “Computational manufacturing of optical interference coatings: method, simulation results, and comparison with experiment,” Appl. Opt. 49, 3150–3162 (2010).
[CrossRef]

O. Stenzel, S. Wilbrandt, and N. Kaiser, “All-oxide broadband antireflection coatings by plasma ion assisted deposition: design, simulation, manufacturing and re-optimization,” Opt. Express 18, 8704–8708 (2010).
[CrossRef]

O. Stenzel, S. Wilbrandt, D. Fasold, and N. Kaiser, “A hybrid in situ monitoring strategy for optical coating deposition: application to the preparation of chirped dielectric mirrors,” J. Opt. A 10, 085305 (2008).
[CrossRef]

S. Wilbrandt, O. Stenzel, N. Kaiser, M. K. Trubetskov, and A. V. Tikhonravov, “In situ optical characterization and re-engineering of interference coatings,” Appl. Opt. 47, C49–C54 (2008).
[CrossRef]

Zoeller, A.

A. Zoeller, M. Boos, H. Hagedorn, and B. Romanov, “Computer simulation of coating processes with monochromatic monitoring,” Proc. SPIE 7101, 71010G (2008).
[CrossRef]

Zorc, H.

Appl. Opt. (20)

B. Vidal, A. Fornier, and E. Pelletier, “Optical monitoring of nonquarterwave multilayer filters,” Appl. Opt. 17, 1038–1047 (1978).
[CrossRef]

H. Macleod, “Monitoring of optical coatings,” Appl. Opt. 20, 82–89 (1981).
[CrossRef]

B. T. Sullivan and J. A. Dobrowolski, “Deposition error compensation for optical multilayer coatings. I. Theoretical description,” Appl. Opt. 31, 3821–3835 (1992).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and G. W. DeBell, “Application of the needle optimization technique to the design of optical coatings,” Appl. Opt. 35, 5493–5508 (1996).
[CrossRef]

A. V. Tikhonravov and M. K. Trubetskov, “Computational manufacturing as a bridge between design and production,” Appl. Opt. 44, 6877–6884 (2005).
[CrossRef]

D. Ristau, H. Ehlers, T. Gross, and M. Lappschies, “Optical broadband monitoring of conventional and ion processes,” Appl. Opt. 45, 1495–1501 (2006).
[CrossRef]

M. Tilsch, K. Hendrix, and P. Verly, “Optical interference coating design contest 2004,” Appl. Opt. 45, 1544–1554(2006).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Investigation of the effect of accumulation of thickness errors in optical coating production using broadband optical monitoring,” Appl. Opt. 45, 7026–7034 (2006).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and G. W. DeBell, “Optical coating design approaches based on the needle optimization technique,” Appl. Opt. 46, 704–710 (2007).
[CrossRef]

B. Badoil, F. Lemarchand, M. Cathelinaud, and M. Lequime, “Interest of broadband optical monitoring for thin-film filter manufacturing,” Appl. Opt. 46, 4294–4303 (2007).
[CrossRef]

S. Wilbrandt, O. Stenzel, N. Kaiser, M. K. Trubetskov, and A. V. Tikhonravov, “In situ optical characterization and re-engineering of interference coatings,” Appl. Opt. 47, C49–C54 (2008).
[CrossRef]

K. Friedrich, S. Wilbrandt, O. Stenzel, N. Kaiser, and K. Hoffmann, “Computational manufacturing of optical interference coatings: method, simulation results, and comparison with experiment,” Appl. Opt. 49, 3150–3162 (2010).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, G. DeBell, V. Pervak, A. K. Sytchkova, M. L. Grilli, and D. Ristau, “Optical parameters of oxide films typically used in optical coating production,” Appl. Opt. 50, C75–C85 (2011).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Investigation of the error self-compensation effect associated with broadband optical monitoring,” Appl. Opt. 50, C111–C116 (2011).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, and V. Pervak, “Estimations of production yields for choosing of a practically optimal optical coating design,” Appl. Opt. 50, C141–C147 (2011).
[CrossRef]

T. V. Amotchkina, M. K. Trubetskov, V. Pervak, S. Schlichting, H. Ehlers, D. Ristau, and A. V. Tikhonravov, “Comparison of algorithms used for optical characterization of multilayer optical coatings,” Appl. Opt. 50, 3389–3395 (2011).
[CrossRef]

T. V. Amotchkina, M. K. Trubetskov, V. Pervak, and A. V. Tikhonravov, “Design, production and reverse engineering of two-octave antireflection coatings,” Appl. Opt. 50, 6468–6475 (2011).
[CrossRef]

A. V. Tikhonravov, T. V. Amotchkina, M. K. Trubetskov, R. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak, “Optical characterization and reverse engineering based on multiangle spectroscopy,” Appl. Opt. 51, 245–254 (2012).
[CrossRef]

A. V. Tikhonravov and M. K. Trubetskov, “Modern design tools and a new paradigm in optical coating design,” Appl. Opt. 51, 7319–7332 (2012).
[CrossRef]

T. V. Amotchkina, S. Schlichting, H. Ehlers, M. K. Trubetskov, A. V. Tikhonravov, and D. Ristau, “Computational manufacturing as a key element in design-production chain for modern multilayer coatings,” Appl. Opt. 51, 7604–7615 (2012).
[CrossRef]

IEICE Trans. Electron. (1)

A. Tikhonravov, M. Trubetskov, and I. Kasahara, “Achievements and challenges in the design and production of high quality optical coatings,” IEICE Trans. Electron. E91-C, 1622–1629 (2008).
[CrossRef]

J. Opt. A (1)

O. Stenzel, S. Wilbrandt, D. Fasold, and N. Kaiser, “A hybrid in situ monitoring strategy for optical coating deposition: application to the preparation of chirped dielectric mirrors,” J. Opt. A 10, 085305 (2008).
[CrossRef]

J. Opt. Technol. (1)

Laser Focus World (1)

J. Kruschwitz, “Software tools speed optical thin-film design,” Laser Focus World 39, 157–166 (2003).

Opt. Express (2)

O. Stenzel, S. Wilbrandt, and N. Kaiser, “All-oxide broadband antireflection coatings by plasma ion assisted deposition: design, simulation, manufacturing and re-optimization,” Opt. Express 18, 8704–8708 (2010).
[CrossRef]

V. Pervak, M. K. Trubetskov, and A. V. Tikhonravov, “Robust synthesis of dispersive mirrors,” Opt. Express 19, 2371–2380 (2011).
[CrossRef]

Proc. SPIE (4)

A. Zoeller, M. Boos, H. Hagedorn, and B. Romanov, “Computer simulation of coating processes with monochromatic monitoring,” Proc. SPIE 7101, 71010G (2008).
[CrossRef]

A. V. Tikhonravov and M. K. Trubetskov, “On-line characterization and reoptimization of optical coatings,” Proc. SPIE 5250, 406–413 (2004).
[CrossRef]

A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, and M. A. Kokarev, “Key role of the coating total optical thickness in solving design problems,” Proc. SPIE 5250, 312–321 (2004).
[CrossRef]

D. Ristau, H. Ehlers, S. Schlichting, and M. Lappschies, “State of art in deterministic production of optical thin films,” Proc. SPIE 7101, 71010C (2008).
[CrossRef]

Other (6)

H. Ehlers, S. Schlichting, C. Schmitz, and D. Ristau, “Hybrid process control for precision optics enhanced by computational manufacturing,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuC6.

A. V. Tikhonravov and M. K. Trubetskov, “Design opportunities for better manufacturability,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), p. WA2.

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “On the reliability of computational estimations used for choosing the most manufacturable design,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuA3.

A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Computational manufacturing experiments for choosing optimal design and monitoring strategy,” in Optical Interference Coatings, Technical Digest (CD) (Optical Society of America, 2011), paper TuA5.

S. Furman and A. V. Tikhonravov, Basics of Optics of Multilayer Systems (Edition Frontieres, 1992).

A. V. Tikhonravov and M. K. Trubetskov, OptiLayer Thin Film Software, http://www.optilayer.com .

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