J. D. Bray, L. Schumann, and T. Lomheim, “Front-side illuminated CMOS spectral pixel response and modulation transfer function characterization: impact of pixel layout details and pixel depletion volume,” Proc. SPIE 7405, 74050Q (2009).

[CrossRef]

J. Bray, K. Gaab, B. Lambert, and T. Lomheim, “Improvements to spectral spot-scanning technique for accurate and efficient data acquisition,” Proc. SPIE 7405, 74050L (2009).

[CrossRef]

J. Lavine, W. Chang, C. Anagnostopoulos, B. Burkey, and E. Nelson, “Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices,” IEEE Trans. Electron Devices 32, 2087–2091 (1985).

[CrossRef]

J. Lavine, W. Chang, C. Anagnostopoulos, B. Burkey, and E. Nelson, “Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices,” IEEE Trans. Electron Devices 32, 2087–2091 (1985).

[CrossRef]

J. Bray, K. Gaab, B. Lambert, and T. Lomheim, “Improvements to spectral spot-scanning technique for accurate and efficient data acquisition,” Proc. SPIE 7405, 74050L (2009).

[CrossRef]

J. D. Bray, L. Schumann, and T. Lomheim, “Front-side illuminated CMOS spectral pixel response and modulation transfer function characterization: impact of pixel layout details and pixel depletion volume,” Proc. SPIE 7405, 74050Q (2009).

[CrossRef]

J. Lavine, W. Chang, C. Anagnostopoulos, B. Burkey, and E. Nelson, “Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices,” IEEE Trans. Electron Devices 32, 2087–2091 (1985).

[CrossRef]

P. Capper and J. Garland, Mercury Cadmium Telluride, Growth, Properties, and Applications (Wiley, 2011).

J. Lavine, W. Chang, C. Anagnostopoulos, B. Burkey, and E. Nelson, “Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices,” IEEE Trans. Electron Devices 32, 2087–2091 (1985).

[CrossRef]

J. Bray, K. Gaab, B. Lambert, and T. Lomheim, “Improvements to spectral spot-scanning technique for accurate and efficient data acquisition,” Proc. SPIE 7405, 74050L (2009).

[CrossRef]

P. Capper and J. Garland, Mercury Cadmium Telluride, Growth, Properties, and Applications (Wiley, 2011).

J. Goodman, Introduction to Fourier Optics (Roberts, 2005).

J. Bray, K. Gaab, B. Lambert, and T. Lomheim, “Improvements to spectral spot-scanning technique for accurate and efficient data acquisition,” Proc. SPIE 7405, 74050L (2009).

[CrossRef]

J. Lavine, W. Chang, C. Anagnostopoulos, B. Burkey, and E. Nelson, “Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices,” IEEE Trans. Electron Devices 32, 2087–2091 (1985).

[CrossRef]

J. D. Bray, L. Schumann, and T. Lomheim, “Front-side illuminated CMOS spectral pixel response and modulation transfer function characterization: impact of pixel layout details and pixel depletion volume,” Proc. SPIE 7405, 74050Q (2009).

[CrossRef]

J. Bray, K. Gaab, B. Lambert, and T. Lomheim, “Improvements to spectral spot-scanning technique for accurate and efficient data acquisition,” Proc. SPIE 7405, 74050L (2009).

[CrossRef]

J. Lavine, W. Chang, C. Anagnostopoulos, B. Burkey, and E. Nelson, “Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices,” IEEE Trans. Electron Devices 32, 2087–2091 (1985).

[CrossRef]

S. Sze and K. Ng, Physics of Semiconductor Devices (Wiley, 2007).

J. D. Bray, L. Schumann, and T. Lomheim, “Front-side illuminated CMOS spectral pixel response and modulation transfer function characterization: impact of pixel layout details and pixel depletion volume,” Proc. SPIE 7405, 74050Q (2009).

[CrossRef]

S. Sze and K. Ng, Physics of Semiconductor Devices (Wiley, 2007).

J. Lavine, W. Chang, C. Anagnostopoulos, B. Burkey, and E. Nelson, “Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices,” IEEE Trans. Electron Devices 32, 2087–2091 (1985).

[CrossRef]

J. D. Bray, L. Schumann, and T. Lomheim, “Front-side illuminated CMOS spectral pixel response and modulation transfer function characterization: impact of pixel layout details and pixel depletion volume,” Proc. SPIE 7405, 74050Q (2009).

[CrossRef]

J. Bray, K. Gaab, B. Lambert, and T. Lomheim, “Improvements to spectral spot-scanning technique for accurate and efficient data acquisition,” Proc. SPIE 7405, 74050L (2009).

[CrossRef]

J. Goodman, Introduction to Fourier Optics (Roberts, 2005).

P. Capper and J. Garland, Mercury Cadmium Telluride, Growth, Properties, and Applications (Wiley, 2011).

S. Sze and K. Ng, Physics of Semiconductor Devices (Wiley, 2007).