S. Li, S. Liu, and H. Zhang, “3D shape measurement of optical free-form surface based on fringe projection,” Proc. SPIE 8082, 80822Z (2011).

[Crossref]

Y. He and Y. Cao, “A composite-structured-light 3D measurement method based on fringe parameter calibration,” Opt. Lasers Eng. 49, 773–779 (2011).

[Crossref]

Y. He and Y. Cao, “Shifted-phase calibration for a 3-D profilometry system based on orthogonal composite grating projection,” Optik 122, 1730–1734 (2011).

F. W. Y. Chan, “A novel optical method without phase unwrapping for subsurface flaw detection,” Opt Lasers Eng. 47, 186–193 (2009).

[Crossref]

G. Häusler, C. Richter, K.-H. Leitz, and M. C. Knauer, “Microdeflectometry—a novel tool to acquire three-dimensional microtopography with nanometer height resolution,” Opt. Lett. 33, 396–398 (2008).

[Crossref]

H. Jing, X. Su, and Y. Liu, “Specular surface measurement based on fringe reflection and analysis of 3D shape reconstruction technique,” Optoelectron. Eng. 35, 37–42 (2008).

W. Chen, P. Bu, S. Zheng, and X. Su, “Study on Fourier transforms profilometry based on bi-color projecting,” Opt. Laser Technol. 39, 821–827 (2007).

[Crossref]

X. Su and W. Chen, “Reliability-guided phase unwrapping algorithm: a review,” Opt Lasers Eng. 42, 245–261 (2004).

[Crossref]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Lasers Eng. 35, 263–284 (2001).

[Crossref]

M. Chang and C.-S. Ho, “Phase-measuring profilometry using sinusoidal grating,” Exp. Mech. 33, 117–122 (1993).

[Crossref]

M. Halioua and H.-C. Liu, “Optical three-dimensional sensing by phase measuring profilometry,” Opt Lasers Eng. 11, 185–215 (1989).

[Crossref]

W. Chen, P. Bu, S. Zheng, and X. Su, “Study on Fourier transforms profilometry based on bi-color projecting,” Opt. Laser Technol. 39, 821–827 (2007).

[Crossref]

Y. He and Y. Cao, “A composite-structured-light 3D measurement method based on fringe parameter calibration,” Opt. Lasers Eng. 49, 773–779 (2011).

[Crossref]

Y. He and Y. Cao, “Shifted-phase calibration for a 3-D profilometry system based on orthogonal composite grating projection,” Optik 122, 1730–1734 (2011).

F. W. Y. Chan, “A novel optical method without phase unwrapping for subsurface flaw detection,” Opt Lasers Eng. 47, 186–193 (2009).

[Crossref]

M. Chang and C.-S. Ho, “Phase-measuring profilometry using sinusoidal grating,” Exp. Mech. 33, 117–122 (1993).

[Crossref]

F. Chen and X. Su, “Phase-unwrapping algorithm for the measurement of 3D object,” Optik 123, 2272–2275 (2012).

[Crossref]

Y.-L. Xiao, X. Su, W. Chen, and Y. Liu, “Three-dimensional shape measurement of aspheric mirrors with fringe reflection photogrammetry,” Appl. Opt. 51, 457–464 (2012).

[Crossref]

W. Chen, P. Bu, S. Zheng, and X. Su, “Study on Fourier transforms profilometry based on bi-color projecting,” Opt. Laser Technol. 39, 821–827 (2007).

[Crossref]

X. Su and W. Chen, “Reliability-guided phase unwrapping algorithm: a review,” Opt Lasers Eng. 42, 245–261 (2004).

[Crossref]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Lasers Eng. 35, 263–284 (2001).

[Crossref]

M. Halioua and H.-C. Liu, “Optical three-dimensional sensing by phase measuring profilometry,” Opt Lasers Eng. 11, 185–215 (1989).

[Crossref]

Y. He and Y. Cao, “A composite-structured-light 3D measurement method based on fringe parameter calibration,” Opt. Lasers Eng. 49, 773–779 (2011).

[Crossref]

Y. He and Y. Cao, “Shifted-phase calibration for a 3-D profilometry system based on orthogonal composite grating projection,” Optik 122, 1730–1734 (2011).

M. Chang and C.-S. Ho, “Phase-measuring profilometry using sinusoidal grating,” Exp. Mech. 33, 117–122 (1993).

[Crossref]

H. Jing, X. Su, and Y. Liu, “Specular surface measurement based on fringe reflection and analysis of 3D shape reconstruction technique,” Optoelectron. Eng. 35, 37–42 (2008).

S. Li, S. Liu, and H. Zhang, “3D shape measurement of optical free-form surface based on fringe projection,” Proc. SPIE 8082, 80822Z (2011).

[Crossref]

M. Halioua and H.-C. Liu, “Optical three-dimensional sensing by phase measuring profilometry,” Opt Lasers Eng. 11, 185–215 (1989).

[Crossref]

S. Li, S. Liu, and H. Zhang, “3D shape measurement of optical free-form surface based on fringe projection,” Proc. SPIE 8082, 80822Z (2011).

[Crossref]

Y.-L. Xiao, X. Su, W. Chen, and Y. Liu, “Three-dimensional shape measurement of aspheric mirrors with fringe reflection photogrammetry,” Appl. Opt. 51, 457–464 (2012).

[Crossref]

H. Jing, X. Su, and Y. Liu, “Specular surface measurement based on fringe reflection and analysis of 3D shape reconstruction technique,” Optoelectron. Eng. 35, 37–42 (2008).

F. Chen and X. Su, “Phase-unwrapping algorithm for the measurement of 3D object,” Optik 123, 2272–2275 (2012).

[Crossref]

Y.-L. Xiao, X. Su, W. Chen, and Y. Liu, “Three-dimensional shape measurement of aspheric mirrors with fringe reflection photogrammetry,” Appl. Opt. 51, 457–464 (2012).

[Crossref]

H. Jing, X. Su, and Y. Liu, “Specular surface measurement based on fringe reflection and analysis of 3D shape reconstruction technique,” Optoelectron. Eng. 35, 37–42 (2008).

W. Chen, P. Bu, S. Zheng, and X. Su, “Study on Fourier transforms profilometry based on bi-color projecting,” Opt. Laser Technol. 39, 821–827 (2007).

[Crossref]

X. Su and W. Chen, “Reliability-guided phase unwrapping algorithm: a review,” Opt Lasers Eng. 42, 245–261 (2004).

[Crossref]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Lasers Eng. 35, 263–284 (2001).

[Crossref]

S. Li, S. Liu, and H. Zhang, “3D shape measurement of optical free-form surface based on fringe projection,” Proc. SPIE 8082, 80822Z (2011).

[Crossref]

W. Chen, P. Bu, S. Zheng, and X. Su, “Study on Fourier transforms profilometry based on bi-color projecting,” Opt. Laser Technol. 39, 821–827 (2007).

[Crossref]

R. Zheng, Y. Wang, X. Zhang, and Y. Song, “Two-dimensional phase-measuring profilometry,” Appl. Opt. 44, 954–958 (2005).

[Crossref]

Y.-L. Xiao, X. Su, W. Chen, and Y. Liu, “Three-dimensional shape measurement of aspheric mirrors with fringe reflection photogrammetry,” Appl. Opt. 51, 457–464 (2012).

[Crossref]

M. Chang and C.-S. Ho, “Phase-measuring profilometry using sinusoidal grating,” Exp. Mech. 33, 117–122 (1993).

[Crossref]

F. W. Y. Chan, “A novel optical method without phase unwrapping for subsurface flaw detection,” Opt Lasers Eng. 47, 186–193 (2009).

[Crossref]

X. Su and W. Chen, “Reliability-guided phase unwrapping algorithm: a review,” Opt Lasers Eng. 42, 245–261 (2004).

[Crossref]

M. Halioua and H.-C. Liu, “Optical three-dimensional sensing by phase measuring profilometry,” Opt Lasers Eng. 11, 185–215 (1989).

[Crossref]

W. Chen, P. Bu, S. Zheng, and X. Su, “Study on Fourier transforms profilometry based on bi-color projecting,” Opt. Laser Technol. 39, 821–827 (2007).

[Crossref]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Lasers Eng. 35, 263–284 (2001).

[Crossref]

Y. He and Y. Cao, “A composite-structured-light 3D measurement method based on fringe parameter calibration,” Opt. Lasers Eng. 49, 773–779 (2011).

[Crossref]

F. Chen and X. Su, “Phase-unwrapping algorithm for the measurement of 3D object,” Optik 123, 2272–2275 (2012).

[Crossref]

Y. He and Y. Cao, “Shifted-phase calibration for a 3-D profilometry system based on orthogonal composite grating projection,” Optik 122, 1730–1734 (2011).

H. Jing, X. Su, and Y. Liu, “Specular surface measurement based on fringe reflection and analysis of 3D shape reconstruction technique,” Optoelectron. Eng. 35, 37–42 (2008).

S. Li, S. Liu, and H. Zhang, “3D shape measurement of optical free-form surface based on fringe projection,” Proc. SPIE 8082, 80822Z (2011).

[Crossref]