Tamer F. Refaat and David G. Johnson, "Absolute linearity measurement of photodetectors using sinusoidal modulated radiation," Appl. Opt. 51, 4420-4429 (2012)
A method is presented for characterizing the linearity of photodetectors based on time-domain analysis of response to sinusoidal excitation. Nonlinearity is quantified solely from the output distortion. Relative response is converted to absolute response by including two calibration points. For low signal level, one calibration point is required, while using dark current as the second point. The response is mapped over a wider range using a series of overlapping sinusoids for calibration transfer. The method is demonstrated with a relatively linear photodiode and a nonlinear phototransistor. A Michelson interferometer is used to generate sinusoidal modulation of a laser source. Results demonstrate the potential of the proposed technique.
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Calibration Results for the Detectors Considered in This Studya
Detector
Photodiode
6.40
256.00
Phototransistor
3.50
296.00
Calibration was performed at 632.8 nm, 20 °C, and listed bias voltage, , with current preamplifier (Stanford Research Systems; SR570) gain, G. A is the device active area.
Table 2.
Statistical and Characterization Results for the Photodiodea
Signal record
1
2
3
Upper voltage limit,
0.71
1.29
1.50
Lower voltage limit,
0.19
0.57
1.17
Four-Parameters Sinusoidal Fitting:
Frequency,
Amplitude,
Offset,
Mean Root-Mean-Square error [mV]
4.46
4.45
5.44
Polynomial Fit:
Nonlinearity polynomial order,
3
1
2
Root-Mean-Square error [mV]
0.52
0.75
0.79
Responsivity Parameters:
0.00
---
---
---
Radiation power offset,
11.20
23.09
33.30
Radiation power amplitude,
6.89
9.58
4.81
Results obtained at bias, 20 °C, and 632.8 nm radiation modulated at approximately 10 kHz. Each signal record consists of 15,000 data points, divided into 30 independent sample records. Statistical data presented as .
Table 3.
Statistical and Characterization Results for the Phototransistora
Signal record
1
2
3
4
5
Upper voltage limit,
0.49
0.90
1.18
1.36
1.49
Lower voltage limit,
0.20
0.45
0.88
1.17
1.36
Four-parameters Sinusoidal Fitting:
Frequency,
Amplitude,
Offset,
Mean Root-Mean-Square error [mV]
8.48
9.67
5.81
4.89
4.71
Polynomial Fit:
Nonlinearity polynomial order,
4
3
3
6
6
Root-Mean-Square error [mV]
0.48
1.02
0.82
0.44
0.41
Responsivity Parameters:
0.00
0.117275
0.38198
---
---
---
---
---
---
---
---
Radiation power offset,
4.73
12.63
23.94
31.74
37.40
Radiation power amplitude,
2.80
6.36
5.62
3.93
2.41
Results obtained at bias, 20 °C, and 632.8 nm radiation modulated at approximately 10 kHz. Each signal record consists of 15,000 data points, divided into 30 independent sample records. Statistical data presented as .
Tables (3)
Table 1.
Calibration Results for the Detectors Considered in This Studya
Detector
Photodiode
6.40
256.00
Phototransistor
3.50
296.00
Calibration was performed at 632.8 nm, 20 °C, and listed bias voltage, , with current preamplifier (Stanford Research Systems; SR570) gain, G. A is the device active area.
Table 2.
Statistical and Characterization Results for the Photodiodea
Signal record
1
2
3
Upper voltage limit,
0.71
1.29
1.50
Lower voltage limit,
0.19
0.57
1.17
Four-Parameters Sinusoidal Fitting:
Frequency,
Amplitude,
Offset,
Mean Root-Mean-Square error [mV]
4.46
4.45
5.44
Polynomial Fit:
Nonlinearity polynomial order,
3
1
2
Root-Mean-Square error [mV]
0.52
0.75
0.79
Responsivity Parameters:
0.00
---
---
---
Radiation power offset,
11.20
23.09
33.30
Radiation power amplitude,
6.89
9.58
4.81
Results obtained at bias, 20 °C, and 632.8 nm radiation modulated at approximately 10 kHz. Each signal record consists of 15,000 data points, divided into 30 independent sample records. Statistical data presented as .
Table 3.
Statistical and Characterization Results for the Phototransistora
Signal record
1
2
3
4
5
Upper voltage limit,
0.49
0.90
1.18
1.36
1.49
Lower voltage limit,
0.20
0.45
0.88
1.17
1.36
Four-parameters Sinusoidal Fitting:
Frequency,
Amplitude,
Offset,
Mean Root-Mean-Square error [mV]
8.48
9.67
5.81
4.89
4.71
Polynomial Fit:
Nonlinearity polynomial order,
4
3
3
6
6
Root-Mean-Square error [mV]
0.48
1.02
0.82
0.44
0.41
Responsivity Parameters:
0.00
0.117275
0.38198
---
---
---
---
---
---
---
---
Radiation power offset,
4.73
12.63
23.94
31.74
37.40
Radiation power amplitude,
2.80
6.36
5.62
3.93
2.41
Results obtained at bias, 20 °C, and 632.8 nm radiation modulated at approximately 10 kHz. Each signal record consists of 15,000 data points, divided into 30 independent sample records. Statistical data presented as .