Abstract

Thin films of high reflecting metal, such as Ag, have a high reflectance in the long-wavelength region. When they are combined with dielectric layers, it is possible, through thin film interference effects, to induce transmission in certain shorter wavelength regions. Thus, they are useful components for the design of long-wavelength cutoff filters with a broad rejection region. In this paper, metal/dielectric multilayer designs based on this principle are numerically investigated. Three designs with different cutoff wavelengths and with very broad transmission regions in the visible or near-IR spectral ranges are presented. An excellent rejection on the long-wavelength side extends beyond 20μm. Experimental results for one of the designs produced in our magnetron sputtering system are given.

© 2011 Optical Society of America

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References

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2000

1999

1996

1995

1978

H. A. MacLeod, “A new approach to the design of metal-dielectric thin film optical coatings,” J. Mod. Opt. 25, 93–106 (1978).
[CrossRef]

1958

1957

Akiyama, T.

Baumeister, P. W.

Berning, P. H.

Byrt, K. L.

Clarke, G.

Dobrowolski, J. A.

Guo, Y.

Y. Guo, J. A. Dobrowolski, L. Li, D. Poitras, and J. Hilfiker, “Implementation of long-wavelength cut-off filters based on critical angle,” Appl. Opt. , doc. ID 132815 (posted 16 September 2010, in press).
[PubMed]

Hilfiker, J.

J. A. Dobrowolski, L. Li, and J. Hilfiker, “Long-wavelength cut-off filters of a new type,” Appl. Opt. 38, 4891–4003 (1999).
[CrossRef]

Y. Guo, J. A. Dobrowolski, L. Li, D. Poitras, and J. Hilfiker, “Implementation of long-wavelength cut-off filters based on critical angle,” Appl. Opt. , doc. ID 132815 (posted 16 September 2010, in press).
[PubMed]

Howe, L.

Kemp, R. A.

Kikuchi, K.

Li, L.

MacLeod, H. A.

H. A. MacLeod, “A new approach to the design of metal-dielectric thin film optical coatings,” J. Mod. Opt. 25, 93–106 (1978).
[CrossRef]

H. A. Macleod, Thin Film Optical Filters, 4th ed. (CRC, 2010).
[CrossRef]

Matsumoto, A.

Osborne, N.

Palik, E. D.

E. D. Palik, Handbook of Optical Constants of Solids I(Academic, 1985).

Poitras, D.

Y. Guo, J. A. Dobrowolski, L. Li, D. Poitras, and J. Hilfiker, “Implementation of long-wavelength cut-off filters based on critical angle,” Appl. Opt. , doc. ID 132815 (posted 16 September 2010, in press).
[PubMed]

Ranger, M.

Song, Y.

Sullivan, B. T.

Thelen, A.

A. Thelen, Design of Optical Interference Coatings (McGraw-Hill, 1988), p. 256.

Turner, A. F.

Appl. Opt.

J. Mod. Opt.

H. A. MacLeod, “A new approach to the design of metal-dielectric thin film optical coatings,” J. Mod. Opt. 25, 93–106 (1978).
[CrossRef]

J. Opt. Soc. Am.

Other

J. A. Dobrowolski, “Coatings and filters,” in Handbook of Optics, W.G.Driscoll and W.Vaughan, eds. (McGraw-Hill, 1978), pp. 8.1–8.124.

H. A. Macleod, Thin Film Optical Filters, 4th ed. (CRC, 2010).
[CrossRef]

J. A. Dobrowolski, “Optical properties of films and coatings,” in Handbook of Optics, 3rd ed., M.Bass, ed. (McGraw-Hill, 2010), Vol. 4, pp. 7.1–7.136.

A. Thelen, Design of Optical Interference Coatings (McGraw-Hill, 1988), p. 256.

E. D. Palik, Handbook of Optical Constants of Solids I(Academic, 1985).

http://optilayer.com/.

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Figures (10)

Fig. 1
Fig. 1

Long-wavelength cutoff filter design with a 50% transmittance in the visible.

Fig. 2
Fig. 2

Long-wavelength cutoff filter design with a 44% transmittance in the near-IR spectral region.

Fig. 3
Fig. 3

Long-wavelength cutoff filter design with a 36% transmittance in the visible and near-IR.

Fig. 4
Fig. 4

Electric field in the transmission region of a long-wavelength cutoff filter of Fig. 1. In this and the following diagram, 0 and 2200 nm on the x scale correspond to the substrate/multilayer and the multilayer/air interfaces. Light is incident from the air side.

Fig. 5
Fig. 5

Electric field in the rejection region of a long-wavelength cutoff filter of Fig. 1.

Fig. 6
Fig. 6

(a) Calculated transmittances in the transmission and rejection regions of the 50% long-wavelength cutoff filter and of a single Ag layer on a BK7 substrate. The total Ag thickness in the 50% transmission region filter is the same as that of the single Ag layer. (b) Ratio of the above two transmittances.

Fig. 7
Fig. 7

Multilayer refractive index profiles for visible transmission region long-wavelength cutoff filters with different transmission region transmittances.

Fig. 8
Fig. 8

Set of visible long-wavelength cutoff filters with different transmittances in the transmission region.

Fig. 9
Fig. 9

(a) Transmission and rejection region transmittances as a function of total Ag thickness in the visible long-wavelength cutoff filters. (b) Blocking power as a function of total Ag thickness of the visible long-wavelength cutoff filters. The line is an exponential fit to the data points.

Fig. 10
Fig. 10

Measured transmittance of an experimentally produced long-wavelength cutoff filter of 50% transmittance in visible spectral region: (a) from 0.4 to 2.0 μm , measured with a spectrophotometer (the dashed curve is the calculated transmittance based on the layer thicknesses determined in the deposition run) and (b) from 2.0 to 20 μm , measured with an IR ellipsometer.

Tables (1)

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Table 1 Optical Constants of Nb 2 O 5 , SiO 2 , and Ag Used in This Paper a

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