Abstract
Precise measurement of the refractive index of chemical vapor deposition (CVD) ZnSe with the Fourier-transform interference refractometry method from 0.9 to (from 11,000 to ) with resolution is described. For this measurement, structurally homogeneous ZnSe plates were grown on a substrate with an optimized temperature increase. Using three ZnSe plates of different thicknesses, we managed to raise the measurement accuracy of the refractive index up to (being nearly 1 order of magnitude better than the available data) in the near IR and most of the middle IR wavelength range from 0.9 to (wavenumber range of ) and up to in the () region. The experimental results are approximated by a generalized Cauchy dispersion function of the 8th power. Spectral wavelength dependencies of the first- and second-order derivatives of the refractive index are calculated, and the zero material dispersion wavelength is found to be .
© 2010 Optical Society of America
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