Abstract
We compare the performance, stability and microstructure of Si/Gd multilayers containing thin barrier layers of W, , or , and determine that multilayers containing thick W barrier layers at each interface provide the best compromise between high peak reflectance in the extreme ultraviolet near and good stability upon heating. The Si/W/Gd films have sharper interfaces and also show vastly superior thermal stability relative to Si/Gd multilayers without barrier layers. We find that these structures have relatively small compressive film stresses, and show good temporal stability thus far. We measured a peak reflectance of 29.7% at , and a spectral bandpass of (FWHM), for an optimized Si/W/Gd multilayer having a period .
© 2009 Optical Society of America
Full Article | PDF ArticleMore Like This
David L. Windt and Jeffrey A. Bellotti
Appl. Opt. 48(26) 4932-4941 (2009)
Benjawan Kjornrattanawanich, David L. Windt, John F. Seely, and Yurii A. Uspenskii
Appl. Opt. 45(8) 1765-1772 (2006)
David L. Windt and Eric M. Gullikson
Appl. Opt. 54(18) 5850-5860 (2015)