Abstract

Electro-optic (EO) modulation devices, which utilize an external electric field to modulate a beam of optical radiation, are strongly affected by parasitic effects, which change the polarization state of the optical beam. As a result, very small changes in the birefringence or optical path length within the EO material can result in very large fluctuations of the amplitude and phase of the optical modulation signal. A method of actively analyzing the modulated beam is described and demonstrated, which eliminates these fluctuations and keeps the modulation device stably operating at its peak responsivity. Applications to electric field detection and measurements are discussed.

© 2007 Optical Society of America

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