J.
B.
Hurtado-Ramos,
J. Blanco-García, A. Fernández, and F. Ribas, "An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations," Meas. Sci. Technol. 12, 644-651 (2001).

[CrossRef]

D.
I.
Farrant,
G.
H. Kaufmann, J. N. Petzing, J. R. Tyrer, B. F. Oreb, and D. Kerr, "Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry," Appl. Opt. 37, 7259-7267 (1998).

[CrossRef]

C.
Joenathan,
B. Franze, P. Haible, and H.
J.
Tiziani, "Speckle interferometry with temporal phase evaluation for measuring large-object deformation," Appl. Opt. 37, 2608-2614 (1998).

[CrossRef]

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

L.
S.
Wang,
K. Jambunathan, B.
N. Dobbins, and S. P. He, "Measurement of three-dimensional surface shape and deformations using phase stepping speckle interferometry," Opt. Eng. 35, 2333-2340 (1996).

[CrossRef]

T.
Takatsuji,
B.
F.
Oreb,
D. I. Farrant, and P. S. Fairman, "Simultaneous measurement of vector components of displacements by ESPI and FFT techniques," in Interferometry VII: Techniques and Analysis, M. Kujawinska, R. J. Pryputniewicz, and M. Takeda, eds.,
Proc. SPIE 2544, 309-316 (1995).

T.
Yoshimura,
M. Zhou, K. Yamahai, and Z. Liyan, "Optimum determination of speckle size to be used in electronic speckle pattern interferometry," Appl. Opt. 34, 87-91 (1995).

[CrossRef]
[PubMed]

A.
J.
Moore and
J.
R. Tyrer, "An electronic speckle pattern interferometer for complete in-plane displacement measurement," Meas. Sci. Technol. 1, 1024-1030 (1990).

[CrossRef]

S.
Winther, "3D strain measurements using ESPI," Opt. Lasers Eng. 8, 45-57 (1988).

[CrossRef]

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

Y.
Arai and
S. Yokozeki, "Electronic speckle pattern interferometry based on spatial fringe analysis method," in Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design, W.Osten, W.P. O.Jueptner, and M.Kujawinska, eds., Proc. SPIE 4398, 14-22 (2001).

J.
B.
Hurtado-Ramos,
J. Blanco-García, A. Fernández, and F. Ribas, "An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations," Meas. Sci. Technol. 12, 644-651 (2001).

[CrossRef]

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

G.
L.
Cloud, Optical Methods of Engineering Analysis (Cambridge U. Press,
1995).

[CrossRef]

L.
S.
Wang,
K. Jambunathan, B.
N. Dobbins, and S. P. He, "Measurement of three-dimensional surface shape and deformations using phase stepping speckle interferometry," Opt. Eng. 35, 2333-2340 (1996).

[CrossRef]

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

T.
Takatsuji,
B.
F.
Oreb,
D. I. Farrant, and P. S. Fairman, "Simultaneous measurement of vector components of displacements by ESPI and FFT techniques," in Interferometry VII: Techniques and Analysis, M. Kujawinska, R. J. Pryputniewicz, and M. Takeda, eds.,
Proc. SPIE 2544, 309-316 (1995).

D.
I.
Farrant,
G.
H. Kaufmann, J. N. Petzing, J. R. Tyrer, B. F. Oreb, and D. Kerr, "Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry," Appl. Opt. 37, 7259-7267 (1998).

[CrossRef]

T.
Takatsuji,
B.
F.
Oreb,
D. I. Farrant, and P. S. Fairman, "Simultaneous measurement of vector components of displacements by ESPI and FFT techniques," in Interferometry VII: Techniques and Analysis, M. Kujawinska, R. J. Pryputniewicz, and M. Takeda, eds.,
Proc. SPIE 2544, 309-316 (1995).

J.
B.
Hurtado-Ramos,
J. Blanco-García, A. Fernández, and F. Ribas, "An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations," Meas. Sci. Technol. 12, 644-651 (2001).

[CrossRef]

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

D.
C.
Ghiglia and
M.
D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (Wiley,
1998).

L.
S.
Wang,
K. Jambunathan, B.
N. Dobbins, and S. P. He, "Measurement of three-dimensional surface shape and deformations using phase stepping speckle interferometry," Opt. Eng. 35, 2333-2340 (1996).

[CrossRef]

J.
B.
Hurtado-Ramos,
J. Blanco-García, A. Fernández, and F. Ribas, "An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations," Meas. Sci. Technol. 12, 644-651 (2001).

[CrossRef]

L.
S.
Wang,
K. Jambunathan, B.
N. Dobbins, and S. P. He, "Measurement of three-dimensional surface shape and deformations using phase stepping speckle interferometry," Opt. Eng. 35, 2333-2340 (1996).

[CrossRef]

R.
Jones and
C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press,
1989).

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

A.
J.
Moore and
C. Pérez-López, "Fringe carrier methods in double-pulsed addition ESPI," Opt. Commun. 141, 203-212 (1997).

[CrossRef]

A.
J.
Moore and
J.
R. Tyrer, "An electronic speckle pattern interferometer for complete in-plane displacement measurement," Meas. Sci. Technol. 1, 1024-1030 (1990).

[CrossRef]

D.
I.
Farrant,
G.
H. Kaufmann, J. N. Petzing, J. R. Tyrer, B. F. Oreb, and D. Kerr, "Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry," Appl. Opt. 37, 7259-7267 (1998).

[CrossRef]

T.
Takatsuji,
B.
F.
Oreb,
I. Farrant, and J. R. Tyrer, "Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method," Appl. Opt. 36, 1438-1445 (1997).

[CrossRef]
[PubMed]

T.
Takatsuji,
B.
F.
Oreb,
D. I. Farrant, and P. S. Fairman, "Simultaneous measurement of vector components of displacements by ESPI and FFT techniques," in Interferometry VII: Techniques and Analysis, M. Kujawinska, R. J. Pryputniewicz, and M. Takeda, eds.,
Proc. SPIE 2544, 309-316 (1995).

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

A.
J.
Moore and
C. Pérez-López, "Fringe carrier methods in double-pulsed addition ESPI," Opt. Commun. 141, 203-212 (1997).

[CrossRef]

D.
C.
Ghiglia and
M.
D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (Wiley,
1998).

J.
B.
Hurtado-Ramos,
J. Blanco-García, A. Fernández, and F. Ribas, "An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations," Meas. Sci. Technol. 12, 644-651 (2001).

[CrossRef]

T.
Takatsuji,
B.
F.
Oreb,
I. Farrant, and J. R. Tyrer, "Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method," Appl. Opt. 36, 1438-1445 (1997).

[CrossRef]
[PubMed]

T.
Takatsuji,
B.
F.
Oreb,
D. I. Farrant, and P. S. Fairman, "Simultaneous measurement of vector components of displacements by ESPI and FFT techniques," in Interferometry VII: Techniques and Analysis, M. Kujawinska, R. J. Pryputniewicz, and M. Takeda, eds.,
Proc. SPIE 2544, 309-316 (1995).

D.
I.
Farrant,
G.
H. Kaufmann, J. N. Petzing, J. R. Tyrer, B. F. Oreb, and D. Kerr, "Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry," Appl. Opt. 37, 7259-7267 (1998).

[CrossRef]

T.
Takatsuji,
B.
F.
Oreb,
I. Farrant, and J. R. Tyrer, "Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method," Appl. Opt. 36, 1438-1445 (1997).

[CrossRef]
[PubMed]

A.
J.
Moore and
J.
R. Tyrer, "An electronic speckle pattern interferometer for complete in-plane displacement measurement," Meas. Sci. Technol. 1, 1024-1030 (1990).

[CrossRef]

L.
S.
Wang,
K. Jambunathan, B.
N. Dobbins, and S. P. He, "Measurement of three-dimensional surface shape and deformations using phase stepping speckle interferometry," Opt. Eng. 35, 2333-2340 (1996).

[CrossRef]

S.
Winther, "3D strain measurements using ESPI," Opt. Lasers Eng. 8, 45-57 (1988).

[CrossRef]

R.
Jones and
C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press,
1989).

Y.
Arai and
S. Yokozeki, "Electronic speckle pattern interferometry based on spatial fringe analysis method," in Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design, W.Osten, W.P. O.Jueptner, and M.Kujawinska, eds., Proc. SPIE 4398, 14-22 (2001).

K.
Creath, "Phase-shifting speckle interferometry," Appl. Opt. 24, 3053-3058 (1985).

[CrossRef]
[PubMed]

G.
Pedrini and
H.
J.
Tiziani, "Double-pulse electronic speckle interferometry for vibration analysis," Appl. Opt. 33, 7857-7863 (1994).

[CrossRef]
[PubMed]

C.
Joenathan,
B. Franze, P. Haible, and H.
J.
Tiziani, "Speckle interferometry with temporal phase evaluation for measuring large-object deformation," Appl. Opt. 37, 2608-2614 (1998).

[CrossRef]

A.
Fernández,
J. Blanco-García, A.
F.
Doval,
J. Bugarín, B. V. Dorrío, C. López, J. M. Alén, M. Pérez-Amor, and J. L. Fernández, "Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method," Appl. Opt. 37, 3440-3446 (1998).

[CrossRef]

T.
Yoshimura,
M. Zhou, K. Yamahai, and Z. Liyan, "Optimum determination of speckle size to be used in electronic speckle pattern interferometry," Appl. Opt. 34, 87-91 (1995).

[CrossRef]
[PubMed]

T.
Takatsuji,
B.
F.
Oreb,
I. Farrant, and J. R. Tyrer, "Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method," Appl. Opt. 36, 1438-1445 (1997).

[CrossRef]
[PubMed]

D.
I.
Farrant,
G.
H. Kaufmann, J. N. Petzing, J. R. Tyrer, B. F. Oreb, and D. Kerr, "Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry," Appl. Opt. 37, 7259-7267 (1998).

[CrossRef]

A.
Martínez,
J.
A.
Rayas,
R. Rodríguez-Vera, and H. J. Puga, "Three-dimensional deformation measurement from the combination of in-plane and out-of-plane electronic speckle pattern interferometers," Appl. Opt. 43, 4652-4658 (2004).

[CrossRef]
[PubMed]

A.
J.
Moore and
J.
R. Tyrer, "An electronic speckle pattern interferometer for complete in-plane displacement measurement," Meas. Sci. Technol. 1, 1024-1030 (1990).

[CrossRef]

J.
B.
Hurtado-Ramos,
J. Blanco-García, A. Fernández, and F. Ribas, "An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations," Meas. Sci. Technol. 12, 644-651 (2001).

[CrossRef]

A.
J.
Moore and
C. Pérez-López, "Fringe carrier methods in double-pulsed addition ESPI," Opt. Commun. 141, 203-212 (1997).

[CrossRef]

L.
S.
Wang,
K. Jambunathan, B.
N. Dobbins, and S. P. He, "Measurement of three-dimensional surface shape and deformations using phase stepping speckle interferometry," Opt. Eng. 35, 2333-2340 (1996).

[CrossRef]

S.
Winther, "3D strain measurements using ESPI," Opt. Lasers Eng. 8, 45-57 (1988).

[CrossRef]

T.
Takatsuji,
B.
F.
Oreb,
D. I. Farrant, and P. S. Fairman, "Simultaneous measurement of vector components of displacements by ESPI and FFT techniques," in Interferometry VII: Techniques and Analysis, M. Kujawinska, R. J. Pryputniewicz, and M. Takeda, eds.,
Proc. SPIE 2544, 309-316 (1995).

D.
C.
Ghiglia and
M.
D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (Wiley,
1998).

Y.
Arai and
S. Yokozeki, "Electronic speckle pattern interferometry based on spatial fringe analysis method," in Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design, W.Osten, W.P. O.Jueptner, and M.Kujawinska, eds., Proc. SPIE 4398, 14-22 (2001).

G.
L.
Cloud, Optical Methods of Engineering Analysis (Cambridge U. Press,
1995).

[CrossRef]

R.
Jones and
C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press,
1989).