Abstract

We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 μm. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for direct measurement of the absolute rotation-dependent phase shift induced by an optical element. Refractive index n(λ) over the whole investigated spectral range is thus obtained directly to an accuracy of 10^-4 without the need for any specific assumption about dispersion. Results for synthetic fused silica are presented and discussed.

© 2003 Optical Society of America

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