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Cavity ringdown spectroscopy of thin films in the mid-infrared

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Abstract

To demonstrate the potential of the cavity ringdown technique in mid-infrared spectroscopy of thin film samples, we measured absorption losses in a C60 film on a BaF2 substrate using a tunable optical parametric amplifier source. With a Brewster angle sample geometry, we achieved a fractional loss sensitivity as small as 1.3 × 10-7 with 1.5 cm-1 resolution, an improvement in sensitivity of 2 orders of magnitude compared to standard Fourier transform infrared methods. At an absorption sensitivity of 5 × 10-7, spectra of several C60 overtone lines were recorded.

© 2002 Optical Society of America

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