Abstract

Spectral measurement of gaseous optical masers has been made by photomixing techniques and noise distribution measurement. Particularly, low-frequency beat components were verified to occur between spatially independent transverse modes of the same order in an experiment of mode control. Frequency-spread of beat components is also discussed.

© 1965 Optical Society of America

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References

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  1. J. P. Goldsborough, Appl. Opt. 3, 267 (1964).
    [CrossRef]
  2. T. Uchida, Quantum Electron. Symp., Sendai, Japan, IV-5, 153 (Feb.1964).
  3. W. R. Bennett, Phys. Rev. 126, 2, 580 (1962).
  4. G. D. Boyd, J. P. Gordon, Bell System Tech. J. 40, 489 (1961).
  5. G. D. Boyd, H. Kogelnik, Bell System Tech. J. 41, 1347 (1962).
  6. T. Uchida, to be published.

1964

J. P. Goldsborough, Appl. Opt. 3, 267 (1964).
[CrossRef]

T. Uchida, Quantum Electron. Symp., Sendai, Japan, IV-5, 153 (Feb.1964).

1962

W. R. Bennett, Phys. Rev. 126, 2, 580 (1962).

G. D. Boyd, H. Kogelnik, Bell System Tech. J. 41, 1347 (1962).

1961

G. D. Boyd, J. P. Gordon, Bell System Tech. J. 40, 489 (1961).

Bennett, W. R.

W. R. Bennett, Phys. Rev. 126, 2, 580 (1962).

Boyd, G. D.

G. D. Boyd, H. Kogelnik, Bell System Tech. J. 41, 1347 (1962).

G. D. Boyd, J. P. Gordon, Bell System Tech. J. 40, 489 (1961).

Goldsborough, J. P.

Gordon, J. P.

G. D. Boyd, J. P. Gordon, Bell System Tech. J. 40, 489 (1961).

Kogelnik, H.

G. D. Boyd, H. Kogelnik, Bell System Tech. J. 41, 1347 (1962).

Uchida, T.

T. Uchida, Quantum Electron. Symp., Sendai, Japan, IV-5, 153 (Feb.1964).

T. Uchida, to be published.

Appl. Opt.

Bell System Tech. J.

G. D. Boyd, J. P. Gordon, Bell System Tech. J. 40, 489 (1961).

G. D. Boyd, H. Kogelnik, Bell System Tech. J. 41, 1347 (1962).

Phys. Rev.

W. R. Bennett, Phys. Rev. 126, 2, 580 (1962).

Quantum Electron. Symp., Sendai, Japan

T. Uchida, Quantum Electron. Symp., Sendai, Japan, IV-5, 153 (Feb.1964).

Other

T. Uchida, to be published.

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Figures (9)

Fig. 1
Fig. 1

Setup of spectral measurement.

Fig. 2
Fig. 2

Mode pattern of the maser without slit.

Fig. 3
Fig. 3

Beat components around 128 Mc/sec in the maser without slit.

Fig. 4
Fig. 4

Low-frequency beat components around the center component in Fig. 3.

Fig. 5
Fig. 5

Mode pattern of the maser with slit.

Fig. 6
Fig. 6

Beat components around 128 Mc/sec in the maser with slit.

Fig. 7
Fig. 7

Center beat component in Fig. 6.

Fig. 8
Fig. 8

Frequency-spread of the beat component in Fig. 7, which was observed with a much higher resolution.

Fig. 9
Fig. 9

Splitting of the 128 Mc/sec beat component in a TEM00 mode operation.

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