Abstract

A fast and efficient technique for profilometric measurement with a color-coded grating is proposed. Eight colors are used to code the grating, and each color represents only one logical state. There are 64 stripes in one period of the color grating, which is large enough for normal measurement. Compared with the previous techniques, it has the advantages of simple hardware without moving mechanical parts, single exposure for obtaining three-dimensional information, little influence from noise and from nonlinearity of the CCD camera on the measurement accuracy, and higher anti-color-blurring capability. The suggested technique is suitable for on-line inspection and dynamic measurement of moving objects.

© 2000 Optical Society of America

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References

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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  14. G. Häusler, D. Ritter, “Parallel three-dimensional sensing by color-coded triangulation,” Appl. Opt. 32, 7164–7169 (1993).
    [CrossRef] [PubMed]

1997

M. Hartrumpf, R. Munser, “Optical three-dimensional measurements by radially symmetric structured light projection,” Appl. Opt. 36, 2923–2928 (1997).
[CrossRef] [PubMed]

H. Fan, H. Zhao, Y. Tan, “Automated three-dimensional surface profilometry using dual-frequency optic fiber phase-shifting method,” Opt. Eng. 36, 3167–3171 (1997).
[CrossRef]

Q. Fang, S. Zheng, “Linearly coded profilometry,” Appl. Opt. 36, 2401–2407 (1997).
[CrossRef] [PubMed]

H. O. Saldner, J. M. Huntley, “Profilometry using temporal phase unwrapping and a spatial light modulator-based fringe projector,” Opt. Eng. 36, 610–615 (1997).
[CrossRef]

M. Wang, J. Zhong, D. Li, “Subfringe integration profilometry of three-dimensional diffuse objects,” Opt. Eng. 36, 2567–2572 (1997).
[CrossRef]

1993

1991

X.-X. Cheng, X.-Y. Su, L.-R. Guo, “Automated measurement method for 360 profilometry of 3-D diffuse objects,” Appl. Opt. 30, 1274–1278 (1991).
[CrossRef] [PubMed]

M. Suganuma, T. Yoshizawa, “Three-dimensional shape analysis by use of a projected grating image,” Opt. Eng. 30, 1529–1533 (1991).
[CrossRef]

1990

1986

1985

G. Bickel, G. Häusler, M. Maul, “Triangulation with expanded rang of depth,” Opt. Eng. 24, 975–977 (1985).
[CrossRef]

J. A. Jalkio, R. C. Kim, S. K. Case, “Three dimensional inspection using multistripe structured light,” Opt. Eng. 24, 966–974 (1985).
[CrossRef]

Alexander, B. F.

B. F. Alexander, “3D shape measurement by active triangulation using an array of coded light stripes,” in Optics, Illumination, and Image Sensing for Machine Vision II, D. J. Svetkoff, ed., Proc. SPIE850, 199–205 (1987).
[CrossRef]

Bickel, G.

G. Bickel, G. Häusler, M. Maul, “Triangulation with expanded rang of depth,” Opt. Eng. 24, 975–977 (1985).
[CrossRef]

Case, S. K.

J. A. Jalkio, R. C. Kim, S. K. Case, “Three dimensional inspection using multistripe structured light,” Opt. Eng. 24, 966–974 (1985).
[CrossRef]

Cheng, X.-X.

Fan, H.

H. Fan, H. Zhao, Y. Tan, “Automated three-dimensional surface profilometry using dual-frequency optic fiber phase-shifting method,” Opt. Eng. 36, 3167–3171 (1997).
[CrossRef]

Fang, Q.

Guo, L.-R.

Hartrumpf, M.

Häusler, G.

G. Häusler, D. Ritter, “Parallel three-dimensional sensing by color-coded triangulation,” Appl. Opt. 32, 7164–7169 (1993).
[CrossRef] [PubMed]

G. Bickel, G. Häusler, M. Maul, “Triangulation with expanded rang of depth,” Opt. Eng. 24, 975–977 (1985).
[CrossRef]

Hung, Y.

Huntley, J. M.

H. O. Saldner, J. M. Huntley, “Profilometry using temporal phase unwrapping and a spatial light modulator-based fringe projector,” Opt. Eng. 36, 610–615 (1997).
[CrossRef]

Iwaasa, Y.

Jalkio, J. A.

J. A. Jalkio, R. C. Kim, S. K. Case, “Three dimensional inspection using multistripe structured light,” Opt. Eng. 24, 966–974 (1985).
[CrossRef]

Kim, R. C.

J. A. Jalkio, R. C. Kim, S. K. Case, “Three dimensional inspection using multistripe structured light,” Opt. Eng. 24, 966–974 (1985).
[CrossRef]

Li, D.

M. Wang, J. Zhong, D. Li, “Subfringe integration profilometry of three-dimensional diffuse objects,” Opt. Eng. 36, 2567–2572 (1997).
[CrossRef]

Li, Z.

Maul, M.

G. Bickel, G. Häusler, M. Maul, “Triangulation with expanded rang of depth,” Opt. Eng. 24, 975–977 (1985).
[CrossRef]

Munser, R.

Ritter, D.

Saldner, H. O.

H. O. Saldner, J. M. Huntley, “Profilometry using temporal phase unwrapping and a spatial light modulator-based fringe projector,” Opt. Eng. 36, 610–615 (1997).
[CrossRef]

Shun, Y.

Su, X.-Y.

Suganuma, M.

M. Suganuma, T. Yoshizawa, “Three-dimensional shape analysis by use of a projected grating image,” Opt. Eng. 30, 1529–1533 (1991).
[CrossRef]

Tan, Y.

H. Fan, H. Zhao, Y. Tan, “Automated three-dimensional surface profilometry using dual-frequency optic fiber phase-shifting method,” Opt. Eng. 36, 3167–3171 (1997).
[CrossRef]

Tang, S.

Toyooka, S.

Wang, M.

M. Wang, J. Zhong, D. Li, “Subfringe integration profilometry of three-dimensional diffuse objects,” Opt. Eng. 36, 2567–2572 (1997).
[CrossRef]

Wu, P.

Yan, Z.

Yoshizawa, T.

M. Suganuma, T. Yoshizawa, “Three-dimensional shape analysis by use of a projected grating image,” Opt. Eng. 30, 1529–1533 (1991).
[CrossRef]

Yu, F.

Zhao, H.

H. Fan, H. Zhao, Y. Tan, “Automated three-dimensional surface profilometry using dual-frequency optic fiber phase-shifting method,” Opt. Eng. 36, 3167–3171 (1997).
[CrossRef]

Zheng, S.

Zhong, J.

M. Wang, J. Zhong, D. Li, “Subfringe integration profilometry of three-dimensional diffuse objects,” Opt. Eng. 36, 2567–2572 (1997).
[CrossRef]

Appl. Opt.

Opt. Eng.

G. Bickel, G. Häusler, M. Maul, “Triangulation with expanded rang of depth,” Opt. Eng. 24, 975–977 (1985).
[CrossRef]

M. Suganuma, T. Yoshizawa, “Three-dimensional shape analysis by use of a projected grating image,” Opt. Eng. 30, 1529–1533 (1991).
[CrossRef]

J. A. Jalkio, R. C. Kim, S. K. Case, “Three dimensional inspection using multistripe structured light,” Opt. Eng. 24, 966–974 (1985).
[CrossRef]

H. Fan, H. Zhao, Y. Tan, “Automated three-dimensional surface profilometry using dual-frequency optic fiber phase-shifting method,” Opt. Eng. 36, 3167–3171 (1997).
[CrossRef]

H. O. Saldner, J. M. Huntley, “Profilometry using temporal phase unwrapping and a spatial light modulator-based fringe projector,” Opt. Eng. 36, 610–615 (1997).
[CrossRef]

M. Wang, J. Zhong, D. Li, “Subfringe integration profilometry of three-dimensional diffuse objects,” Opt. Eng. 36, 2567–2572 (1997).
[CrossRef]

Other

B. F. Alexander, “3D shape measurement by active triangulation using an array of coded light stripes,” in Optics, Illumination, and Image Sensing for Machine Vision II, D. J. Svetkoff, ed., Proc. SPIE850, 199–205 (1987).
[CrossRef]

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Figures (5)

Fig. 1
Fig. 1

Configuration diagram of measuring system.

Fig. 2
Fig. 2

Arrangement of color-coded grating.

Fig. 3
Fig. 3

Schematic diagram of measurement system.

Fig. 4
Fig. 4

Color-coded grating pattern of the triangle specimen.

Fig. 5
Fig. 5

(a) Model of a young boy’s head. (b) Color-grating pattern deformed by the object surface. (c) Object image after color purification. (d) 3-D reconstruction of the model.

Tables (2)

Tables Icon

Table 1 Binary Values and Their Color-Codinga Arrangement

Tables Icon

Table 2 Data of Height Measured by Mechanical Contact Profile and Color-Coded Grating Profilometry (in millimeters)

Equations (2)

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Zx, yAB=L-Zx, yPC.
Zx, y=LPC+AB×AB=LPC+β×S×β×S,

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