Abstract

Pattern recognition with high discrimination can be achieved with a morphological correlator. A modification of this correlator is carried out by use of a binary slicing process instead of linear thresholding. Although the obtained correlation result is not identical to the conventional morphological correlation, it requires fewer calculations and provides even higher discrimination. Two optical experimental implementations of this modified morphological correlator as well as some experimental results are shown.

© 1999 Optical Society of America

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