Pattern recognition with high discrimination can be achieved with a
morphological correlator. A modification of this correlator is
carried out by use of a binary slicing process instead of linear
thresholding. Although the obtained correlation result is not
identical to the conventional morphological correlation, it requires
fewer calculations and provides even higher discrimination. Two
optical experimental implementations of this modified morphological
correlator as well as some experimental results are shown.
© 1999 Optical Society of America
Equations on this page are rendered with MathJax. Learn more.