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Optical frequency-domain imaging microprofilometry with a frequency-tunable liquid-crystal Fabry–Perot etalon device

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Abstract

An optical frequency-domain interference microscope with a liquid-crystal Fabry–Perot interferometer as an optical frequency-scan device was developed for microscopic three-dimensional shape measurements. The proposed system can perform absolute measurement of the discontinuous surface profile of a microscopic object without use of mechanically moving components such as a piezoelectric transducer or a grating spectrometer. Experimental results are presented that demonstrate the validity of the principle.

© 1999 Optical Society of America

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