Abstract

We investigated four different approximation models for describing the polychromatic reflectance and transmittance of a slab with a randomly rough boundary while taking into account the coherent and the incoherent scattering of the rough boundary. Comparisons with experiments (an etched-silicon wafer) show that approximation models that apply a two-scale roughness to the randomly rough boundary and that take into account the coherent and the incoherent scattering yield better agreement and extend the range of validity of the approximation to shorter wavelengths.

© 1999 Optical Society of America

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