I. Daubechies, “Orthonormal bases of compactly supported wavelets,” Commun. Pure Appl. Math. 41, 909–996 (1998).

[Crossref]

N. Zhu, F. P. Chiang, “Vibrational mode shape identification by digital speckle correlation (DISC),” Exp. Tech. 20, 17–19 (1997).

[Crossref]

Y. C. Chan, X. Dai, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of delaminations in multilayer ceramic capacitors using improved digital speckle correlation method,” Microwave Opt. Technol. Lett. 16, 80–85 (1997).

[Crossref]

G. S. Spagnolo, D. Paoletti, “Digital speckle correlation for on-line real-time measurement,” Opt. Commun. 132, 24–28 (1996).

[Crossref]

A. Quinquis, S. Rossignol, “Noise reduction, with a noise reference, of underwater magnetic signals,” Digital Signal Processing 6, 240–248 (1996).

[Crossref]

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, D. Picard, “Wavelet Shrinkage: asymptopia?” J. R. Stat. Soc. B 57, 301–337 (1995).

D. Coburn, J. Slevin, “Digital correlation system for nondestructive testing of thermally stressed ceramics,” Appl. Opt. 34, 5977–5986 (1995).

[Crossref]
[PubMed]

D. L. Donoho, “De-noising by soft thresholding,” IEEE Trans. Inform. Theory 41, 613–627 (1995).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of defects in miniaturized multilayer ceramic capacitors using digital speckle correlation techniques,” IEEE Trans. Components Package. Manufact. Technol. Part A 18, 677–684 (1995).

[Crossref]

G. C. Jin, J. B. Rui, B. Y. Xu, “A new digital speckle correlation method and its application,” Acta Mech. Sinica 26, 599–607 (1994).

D. L. Donoho, I. M. Johnstone, “Ideal spatial adaptation via wavelet shrinkage,” Biometrika 81, 425–455 (1994).

[Crossref]

M. Frisch, H. Messer, “The use of the wavelet transform in the detection of an unknown transient signal,” IEEE Trans. Inform. Theory 38, 892–897 (1992).

[Crossref]

R. R. Coifman, M. V. Wickerhauser, “Entropy based algorithms for best basis selection,” IEEE Trans. Inform. Theory 38, 713–718 (1992).

[Crossref]

S. G. Mallat, “Multiresolution approximations and wavelet orthonormal bases of L2®,” Trans. Am. Math. Soc. 315, 69–87 (1989).

H. A. Bruck, S. R. McNeill, M. A. Sutton, W. H. Peters, “Digital image correlation using Newton–Raphson method of partial differential correlation,” Exp. Mech. 29, 261–267 (1989).

[Crossref]

W. H. Peters, M. A. Sutton, W. F. Ranson, W. P. Poplin, S. R. McNeill, “Whole-field experimental displacement analysis of composite cylinders,” Exp. Mech. 29, 58–62 (1989).

[Crossref]

M. A. Sutton, M. Cheng, W. H. Peters, Y. J. Chao, S. R. McNeill, “Application of an optimised digital correlation method to planar deformation analysis,” Image Vision Comput. 4, 143–150 (1986).

[Crossref]

M. A. Sutton, W. J. Wolters, W. H. Peters, W. F. Ranson, S. R. McNeill, “Computer vision determination of displacement using an improved digital correlation method,” Image Vision Comput. 1, 133–139 (1983).

[Crossref]

W. H. Peters, W. F. Ranson, “Digital imaging techniques in experimental stress analysis,” Opt. Eng. 21, 427–431 (1982).

[Crossref]

Y. C. Chan, X. Dai, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of delaminations in multilayer ceramic capacitors using improved digital speckle correlation method,” Microwave Opt. Technol. Lett. 16, 80–85 (1997).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of defects in miniaturized multilayer ceramic capacitors using digital speckle correlation techniques,” IEEE Trans. Components Package. Manufact. Technol. Part A 18, 677–684 (1995).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Gin, N. K. Bao, P. S. Chung, “In situ detection of flaws in multilayer ceramic capacitors using electronic speckle pattern interferometry,” in Nondestructive Characterization of Materials VI, R. E. Green, K. J. Kozaczek, C. O. Ruud, eds. (Plenum, New York, 1994), pp. 445–452.

H. A. Bruck, S. R. McNeill, M. A. Sutton, W. H. Peters, “Digital image correlation using Newton–Raphson method of partial differential correlation,” Exp. Mech. 29, 261–267 (1989).

[Crossref]

Y. C. Chan, X. Dai, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of delaminations in multilayer ceramic capacitors using improved digital speckle correlation method,” Microwave Opt. Technol. Lett. 16, 80–85 (1997).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of defects in miniaturized multilayer ceramic capacitors using digital speckle correlation techniques,” IEEE Trans. Components Package. Manufact. Technol. Part A 18, 677–684 (1995).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Gin, N. K. Bao, P. S. Chung, “In situ detection of flaws in multilayer ceramic capacitors using electronic speckle pattern interferometry,” in Nondestructive Characterization of Materials VI, R. E. Green, K. J. Kozaczek, C. O. Ruud, eds. (Plenum, New York, 1994), pp. 445–452.

M. A. Sutton, M. Cheng, W. H. Peters, Y. J. Chao, S. R. McNeill, “Application of an optimised digital correlation method to planar deformation analysis,” Image Vision Comput. 4, 143–150 (1986).

[Crossref]

M. A. Sutton, M. Cheng, W. H. Peters, Y. J. Chao, S. R. McNeill, “Application of an optimised digital correlation method to planar deformation analysis,” Image Vision Comput. 4, 143–150 (1986).

[Crossref]

N. Zhu, F. P. Chiang, “Vibrational mode shape identification by digital speckle correlation (DISC),” Exp. Tech. 20, 17–19 (1997).

[Crossref]

Y. C. Chan, X. Dai, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of delaminations in multilayer ceramic capacitors using improved digital speckle correlation method,” Microwave Opt. Technol. Lett. 16, 80–85 (1997).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of defects in miniaturized multilayer ceramic capacitors using digital speckle correlation techniques,” IEEE Trans. Components Package. Manufact. Technol. Part A 18, 677–684 (1995).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Gin, N. K. Bao, P. S. Chung, “In situ detection of flaws in multilayer ceramic capacitors using electronic speckle pattern interferometry,” in Nondestructive Characterization of Materials VI, R. E. Green, K. J. Kozaczek, C. O. Ruud, eds. (Plenum, New York, 1994), pp. 445–452.

R. R. Coifman, M. V. Wickerhauser, “Entropy based algorithms for best basis selection,” IEEE Trans. Inform. Theory 38, 713–718 (1992).

[Crossref]

Y. C. Chan, X. Dai, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of delaminations in multilayer ceramic capacitors using improved digital speckle correlation method,” Microwave Opt. Technol. Lett. 16, 80–85 (1997).

[Crossref]

I. Daubechies, “Orthonormal bases of compactly supported wavelets,” Commun. Pure Appl. Math. 41, 909–996 (1998).

[Crossref]

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, D. Picard, “Wavelet Shrinkage: asymptopia?” J. R. Stat. Soc. B 57, 301–337 (1995).

D. L. Donoho, “De-noising by soft thresholding,” IEEE Trans. Inform. Theory 41, 613–627 (1995).

[Crossref]

D. L. Donoho, I. M. Johnstone, “Ideal spatial adaptation via wavelet shrinkage,” Biometrika 81, 425–455 (1994).

[Crossref]

M. Frisch, H. Messer, “The use of the wavelet transform in the detection of an unknown transient signal,” IEEE Trans. Inform. Theory 38, 892–897 (1992).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Gin, N. K. Bao, P. S. Chung, “In situ detection of flaws in multilayer ceramic capacitors using electronic speckle pattern interferometry,” in Nondestructive Characterization of Materials VI, R. E. Green, K. J. Kozaczek, C. O. Ruud, eds. (Plenum, New York, 1994), pp. 445–452.

Y. C. Chan, X. Dai, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of delaminations in multilayer ceramic capacitors using improved digital speckle correlation method,” Microwave Opt. Technol. Lett. 16, 80–85 (1997).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of defects in miniaturized multilayer ceramic capacitors using digital speckle correlation techniques,” IEEE Trans. Components Package. Manufact. Technol. Part A 18, 677–684 (1995).

[Crossref]

G. C. Jin, J. B. Rui, B. Y. Xu, “A new digital speckle correlation method and its application,” Acta Mech. Sinica 26, 599–607 (1994).

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, D. Picard, “Wavelet Shrinkage: asymptopia?” J. R. Stat. Soc. B 57, 301–337 (1995).

D. L. Donoho, I. M. Johnstone, “Ideal spatial adaptation via wavelet shrinkage,” Biometrika 81, 425–455 (1994).

[Crossref]

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, D. Picard, “Wavelet Shrinkage: asymptopia?” J. R. Stat. Soc. B 57, 301–337 (1995).

S. G. Mallat, “Multiresolution approximations and wavelet orthonormal bases of L2®,” Trans. Am. Math. Soc. 315, 69–87 (1989).

W. H. Peters, M. A. Sutton, W. F. Ranson, W. P. Poplin, S. R. McNeill, “Whole-field experimental displacement analysis of composite cylinders,” Exp. Mech. 29, 58–62 (1989).

[Crossref]

H. A. Bruck, S. R. McNeill, M. A. Sutton, W. H. Peters, “Digital image correlation using Newton–Raphson method of partial differential correlation,” Exp. Mech. 29, 261–267 (1989).

[Crossref]

M. A. Sutton, M. Cheng, W. H. Peters, Y. J. Chao, S. R. McNeill, “Application of an optimised digital correlation method to planar deformation analysis,” Image Vision Comput. 4, 143–150 (1986).

[Crossref]

M. A. Sutton, W. J. Wolters, W. H. Peters, W. F. Ranson, S. R. McNeill, “Computer vision determination of displacement using an improved digital correlation method,” Image Vision Comput. 1, 133–139 (1983).

[Crossref]

M. Frisch, H. Messer, “The use of the wavelet transform in the detection of an unknown transient signal,” IEEE Trans. Inform. Theory 38, 892–897 (1992).

[Crossref]

G. S. Spagnolo, D. Paoletti, “Digital speckle correlation for on-line real-time measurement,” Opt. Commun. 132, 24–28 (1996).

[Crossref]

H. A. Bruck, S. R. McNeill, M. A. Sutton, W. H. Peters, “Digital image correlation using Newton–Raphson method of partial differential correlation,” Exp. Mech. 29, 261–267 (1989).

[Crossref]

W. H. Peters, M. A. Sutton, W. F. Ranson, W. P. Poplin, S. R. McNeill, “Whole-field experimental displacement analysis of composite cylinders,” Exp. Mech. 29, 58–62 (1989).

[Crossref]

M. A. Sutton, M. Cheng, W. H. Peters, Y. J. Chao, S. R. McNeill, “Application of an optimised digital correlation method to planar deformation analysis,” Image Vision Comput. 4, 143–150 (1986).

[Crossref]

M. A. Sutton, W. J. Wolters, W. H. Peters, W. F. Ranson, S. R. McNeill, “Computer vision determination of displacement using an improved digital correlation method,” Image Vision Comput. 1, 133–139 (1983).

[Crossref]

W. H. Peters, W. F. Ranson, “Digital imaging techniques in experimental stress analysis,” Opt. Eng. 21, 427–431 (1982).

[Crossref]

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, D. Picard, “Wavelet Shrinkage: asymptopia?” J. R. Stat. Soc. B 57, 301–337 (1995).

W. H. Peters, M. A. Sutton, W. F. Ranson, W. P. Poplin, S. R. McNeill, “Whole-field experimental displacement analysis of composite cylinders,” Exp. Mech. 29, 58–62 (1989).

[Crossref]

A. Quinquis, S. Rossignol, “Noise reduction, with a noise reference, of underwater magnetic signals,” Digital Signal Processing 6, 240–248 (1996).

[Crossref]

W. H. Peters, M. A. Sutton, W. F. Ranson, W. P. Poplin, S. R. McNeill, “Whole-field experimental displacement analysis of composite cylinders,” Exp. Mech. 29, 58–62 (1989).

[Crossref]

M. A. Sutton, W. J. Wolters, W. H. Peters, W. F. Ranson, S. R. McNeill, “Computer vision determination of displacement using an improved digital correlation method,” Image Vision Comput. 1, 133–139 (1983).

[Crossref]

W. H. Peters, W. F. Ranson, “Digital imaging techniques in experimental stress analysis,” Opt. Eng. 21, 427–431 (1982).

[Crossref]

A. Quinquis, S. Rossignol, “Noise reduction, with a noise reference, of underwater magnetic signals,” Digital Signal Processing 6, 240–248 (1996).

[Crossref]

G. C. Jin, J. B. Rui, B. Y. Xu, “A new digital speckle correlation method and its application,” Acta Mech. Sinica 26, 599–607 (1994).

G. S. Spagnolo, D. Paoletti, “Digital speckle correlation for on-line real-time measurement,” Opt. Commun. 132, 24–28 (1996).

[Crossref]

W. H. Peters, M. A. Sutton, W. F. Ranson, W. P. Poplin, S. R. McNeill, “Whole-field experimental displacement analysis of composite cylinders,” Exp. Mech. 29, 58–62 (1989).

[Crossref]

H. A. Bruck, S. R. McNeill, M. A. Sutton, W. H. Peters, “Digital image correlation using Newton–Raphson method of partial differential correlation,” Exp. Mech. 29, 261–267 (1989).

[Crossref]

M. A. Sutton, M. Cheng, W. H. Peters, Y. J. Chao, S. R. McNeill, “Application of an optimised digital correlation method to planar deformation analysis,” Image Vision Comput. 4, 143–150 (1986).

[Crossref]

M. A. Sutton, W. J. Wolters, W. H. Peters, W. F. Ranson, S. R. McNeill, “Computer vision determination of displacement using an improved digital correlation method,” Image Vision Comput. 1, 133–139 (1983).

[Crossref]

R. R. Coifman, M. V. Wickerhauser, “Entropy based algorithms for best basis selection,” IEEE Trans. Inform. Theory 38, 713–718 (1992).

[Crossref]

M. A. Sutton, W. J. Wolters, W. H. Peters, W. F. Ranson, S. R. McNeill, “Computer vision determination of displacement using an improved digital correlation method,” Image Vision Comput. 1, 133–139 (1983).

[Crossref]

G. C. Jin, J. B. Rui, B. Y. Xu, “A new digital speckle correlation method and its application,” Acta Mech. Sinica 26, 599–607 (1994).

Y. C. Chan, F. Yeung, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of defects in miniaturized multilayer ceramic capacitors using digital speckle correlation techniques,” IEEE Trans. Components Package. Manufact. Technol. Part A 18, 677–684 (1995).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Gin, N. K. Bao, P. S. Chung, “In situ detection of flaws in multilayer ceramic capacitors using electronic speckle pattern interferometry,” in Nondestructive Characterization of Materials VI, R. E. Green, K. J. Kozaczek, C. O. Ruud, eds. (Plenum, New York, 1994), pp. 445–452.

N. Zhu, F. P. Chiang, “Vibrational mode shape identification by digital speckle correlation (DISC),” Exp. Tech. 20, 17–19 (1997).

[Crossref]

G. C. Jin, J. B. Rui, B. Y. Xu, “A new digital speckle correlation method and its application,” Acta Mech. Sinica 26, 599–607 (1994).

D. L. Donoho, I. M. Johnstone, “Ideal spatial adaptation via wavelet shrinkage,” Biometrika 81, 425–455 (1994).

[Crossref]

I. Daubechies, “Orthonormal bases of compactly supported wavelets,” Commun. Pure Appl. Math. 41, 909–996 (1998).

[Crossref]

A. Quinquis, S. Rossignol, “Noise reduction, with a noise reference, of underwater magnetic signals,” Digital Signal Processing 6, 240–248 (1996).

[Crossref]

H. A. Bruck, S. R. McNeill, M. A. Sutton, W. H. Peters, “Digital image correlation using Newton–Raphson method of partial differential correlation,” Exp. Mech. 29, 261–267 (1989).

[Crossref]

W. H. Peters, M. A. Sutton, W. F. Ranson, W. P. Poplin, S. R. McNeill, “Whole-field experimental displacement analysis of composite cylinders,” Exp. Mech. 29, 58–62 (1989).

[Crossref]

N. Zhu, F. P. Chiang, “Vibrational mode shape identification by digital speckle correlation (DISC),” Exp. Tech. 20, 17–19 (1997).

[Crossref]

Y. C. Chan, F. Yeung, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of defects in miniaturized multilayer ceramic capacitors using digital speckle correlation techniques,” IEEE Trans. Components Package. Manufact. Technol. Part A 18, 677–684 (1995).

[Crossref]

R. R. Coifman, M. V. Wickerhauser, “Entropy based algorithms for best basis selection,” IEEE Trans. Inform. Theory 38, 713–718 (1992).

[Crossref]

D. L. Donoho, “De-noising by soft thresholding,” IEEE Trans. Inform. Theory 41, 613–627 (1995).

[Crossref]

M. Frisch, H. Messer, “The use of the wavelet transform in the detection of an unknown transient signal,” IEEE Trans. Inform. Theory 38, 892–897 (1992).

[Crossref]

M. A. Sutton, W. J. Wolters, W. H. Peters, W. F. Ranson, S. R. McNeill, “Computer vision determination of displacement using an improved digital correlation method,” Image Vision Comput. 1, 133–139 (1983).

[Crossref]

M. A. Sutton, M. Cheng, W. H. Peters, Y. J. Chao, S. R. McNeill, “Application of an optimised digital correlation method to planar deformation analysis,” Image Vision Comput. 4, 143–150 (1986).

[Crossref]

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, D. Picard, “Wavelet Shrinkage: asymptopia?” J. R. Stat. Soc. B 57, 301–337 (1995).

Y. C. Chan, X. Dai, G. C. Jin, N. K. Bao, P. S. Chung, “Nondestructive detection of delaminations in multilayer ceramic capacitors using improved digital speckle correlation method,” Microwave Opt. Technol. Lett. 16, 80–85 (1997).

[Crossref]

G. S. Spagnolo, D. Paoletti, “Digital speckle correlation for on-line real-time measurement,” Opt. Commun. 132, 24–28 (1996).

[Crossref]

W. H. Peters, W. F. Ranson, “Digital imaging techniques in experimental stress analysis,” Opt. Eng. 21, 427–431 (1982).

[Crossref]

S. G. Mallat, “Multiresolution approximations and wavelet orthonormal bases of L2®,” Trans. Am. Math. Soc. 315, 69–87 (1989).

Y. C. Chan, F. Yeung, G. C. Gin, N. K. Bao, P. S. Chung, “In situ detection of flaws in multilayer ceramic capacitors using electronic speckle pattern interferometry,” in Nondestructive Characterization of Materials VI, R. E. Green, K. J. Kozaczek, C. O. Ruud, eds. (Plenum, New York, 1994), pp. 445–452.