Abstract

Optical computerized tomography (OCT) technology is used to reconstruct the asymmetric three-dimensional temperature field generated by radiators and electronic chips. First, the OCT method is described. Second, the reconstructed results are tested by a double-cylinder radiator model. Finally, OCT is applied to reconstruction of the temperature field above the surface of a CPU. The air-temperature field above a CPU circuit can be imaged with an OCT system that reflects whether the heat production from different parts of the CPU is even; therefore possibly the technique can be used to determine whether the integrated-circuit design in the CPU is smart.

© 1999 Optical Society of America

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