Abstract

A method for obtaining a direct full field display of in-plane strain contours is demonstrated. On another front, the paper proposes the basis of a multi-sensitivity high resolution moiré photography system for in-plane displacement measurement.

© 1998 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. J. M. Burch, C. Forno, “A high sensitivity moiré grid technique for studying deformation in large objects,” Opt. Eng. 14,178–185 (1975).
    [CrossRef]
  2. J. M. Burch, C. Forno, “High resolution moiré photography,” Opt. Eng. 12,602–614 (1982).
  3. C. Forno, “Deformation measurement using high resolution moiré photography,” Optics and Lasers in Engineering 8,189–212 (1988).
    [CrossRef]

1988 (1)

C. Forno, “Deformation measurement using high resolution moiré photography,” Optics and Lasers in Engineering 8,189–212 (1988).
[CrossRef]

1982 (1)

J. M. Burch, C. Forno, “High resolution moiré photography,” Opt. Eng. 12,602–614 (1982).

1975 (1)

J. M. Burch, C. Forno, “A high sensitivity moiré grid technique for studying deformation in large objects,” Opt. Eng. 14,178–185 (1975).
[CrossRef]

Burch, J. M.

J. M. Burch, C. Forno, “High resolution moiré photography,” Opt. Eng. 12,602–614 (1982).

J. M. Burch, C. Forno, “A high sensitivity moiré grid technique for studying deformation in large objects,” Opt. Eng. 14,178–185 (1975).
[CrossRef]

Forno, C.

C. Forno, “Deformation measurement using high resolution moiré photography,” Optics and Lasers in Engineering 8,189–212 (1988).
[CrossRef]

J. M. Burch, C. Forno, “High resolution moiré photography,” Opt. Eng. 12,602–614 (1982).

J. M. Burch, C. Forno, “A high sensitivity moiré grid technique for studying deformation in large objects,” Opt. Eng. 14,178–185 (1975).
[CrossRef]

Opt. Eng. (2)

J. M. Burch, C. Forno, “A high sensitivity moiré grid technique for studying deformation in large objects,” Opt. Eng. 14,178–185 (1975).
[CrossRef]

J. M. Burch, C. Forno, “High resolution moiré photography,” Opt. Eng. 12,602–614 (1982).

Optics and Lasers in Engineering (1)

C. Forno, “Deformation measurement using high resolution moiré photography,” Optics and Lasers in Engineering 8,189–212 (1988).
[CrossRef]

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (7)

Figure 1
Figure 1

Schematic of high resolution moiré shearography for obtaining in-plane strain contours.

Figure 2
Figure 2

(a) Schematic of the- two Tour-slot pupil arrangements covering the split-lens device and (b) its corresponding monochromatic optical transfer function along the x direction; b shows 2× magnified view.

Figure 3
Figure 3

Setup for reconstructing moiré shearograms.

Figure 4
Figure 4

Examples of moiré shearograms corresponding to in-plane strain derivatives (a) ∂u/∂x and (b, c) ∂ν/∂x.

Figure 5
Figure 5

Examples of moiré shearograms corresponding to In-plane strain derivatives (a) ∂u/∂y and (β) ∂ν/∂y.

Figure 6
Figure 6

Schematic of (a) four alit and (b) square aperture mask to cover the imaging lens. The monochromatic optical transfer function of the two pupil functions are are shown in (d) and (c) respectively; c and d show 2× magnified view.

Figure 7
Figure 7

(a) Periodic patterns of frequencies f o and ¾f o are applied on the specimen surface. (b, c) Reconstructed images of the specimen obtained by the spatial filtering process.

Equations (5)

Equations on this page are rendered with MathJax. Learn more.

u ( P ) u ( P ) = Δ x ( u / x )
u / x = n 1 p 0 / Δ x
ν / x = n 2 p 0 / Δ x
f i = d / s λ
f o = m f i = d / s λ

Metrics