Abstract

A dual-grating sensor head, which was designed for temperature-insensitive strain measurement, was used to measure fast-varying strain perturbations. Using a Mach-Zehnder interferometer technique, we obtained ∼0.1-με (microstrain) rms resolution with a 200-Hz strain input. The feasibility of measuring a dynamic-strain with a static-strain measuring configuration was also demonstrated.

© 1998 Optical Society of America

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