Abstract

Suitable illumination is a crucial aspect in the successful solution of machine vision problems. In this research we used objective image evaluation techniques and found that fluorescence imaging is superior to conventional illumination for acquiring images of integrated circuit lead bonds. This is an interesting and surprising finding, since there was no a priori reason to expect that any part of the bond would contain fluorescent components. Consequently, fluorescence imaging should be considered as an option in designing machine vision systems, especially if conventional illumination systems do not produce images of adequate quality. In this research we discovered a novel and effective method for threshold selection.

© 1992 Optical Society of America

LED light design method for high contrast and uniform illumination imaging in machine vision

Xiaojun Wu and Guangming Gao
Appl. Opt. 57(7) 1694-1704 (2018)

Fabric inspection by near-infrared machine vision

María S. Millán and Jaume Escofet
Opt. Lett. 29(13) 1440-1442 (2004)

Machine-vision techniques for inspection of printed wiring boards and thick-film circuits

Jorge L. C. Sanz and Anil K. Jain
J. Opt. Soc. Am. A 3(9) 1465-1482 (1986)

Design of a composite lighting system based on a freeform and a rod lens for machine vision

Xing Peng, Lingbao Kong, and Xiang Sun
Appl. Opt. 61(8) 2108-2117 (2022)

Measurement of shaft diameters by machine vision

Guang Wei and Qingchang Tan
Appl. Opt. 50(19) 3246-3253 (2011)