Abstract

We demonstrate an instrument which enables the combined operation of a moire deflectometer, Fizeau interferometer, and schlieren device. By using each mode separately, it is possible to compare the three methods, and by combined operation, to benefit from the advantages of each method.

© 1988 Optical Society of America

High-sensitivity reflection-transmission moire deflectometer

Oded Kafri and Ilana Glatt
Appl. Opt. 27(2) 351-353 (1988)

Moire deflectometry with a focused beam: radius of curvature, microscopy, and thickness analysis

Oded Kafri, Eliezer Keren, Kathi Kreske, and Yaacov Zac
Appl. Opt. 29(1) 133-136 (1990)

Phase object microscopy using moire deflectometry

J. Krasinski, D. F. Heller, and O. Kafri
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Rainbow schlieren vs Mach-Zehnder interferometer: a comparison

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Multiplicative moiré two-beam phase-stepping and Fourier-transform methods for the evaluation of multiple-beam Fizeau patterns: a comparison

Benito V. Dorrío, Carlos López, José M. Alén, Javier Bugarín, Antonio Fernández, Angel F. Doval, Jesús Blanco-García, Mariano Pérez-Amor, and José L. Fernández
Appl. Opt. 37(10) 1945-1952 (1998)