Abstract

Refractive indices of deposited thin films of amorphous GeO₂:SiO₂ mixtures were determined by multimode optical waveguide measurement techniques at four different wavelengths and used to characterize waveguide properties as a function of material composition. The results indicate that the refractive index varies linearly with the mole fraction of GeO₂ in the guide, while wavelength dispersion increases with heavier GeO₂ dopant concentrations. This is consistent with previously reported findings for bulk samples and suggests that linear variation of the film’s compositional content is a viable method for obtaining refractive indices and dispersive properties needed to interface with other optical devices in integrated optics-type applications.

© 1985 Optical Society of America

Study of refractive index of GeO₂:SiO₂ mixtures using deposited-thin-film optical waveguides: erratum

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