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Raman characterization of all-dielectric multilayer SiO2/TiO2 optical coatings

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Abstract

Raman spectroscopy can be used to characterize the rutile/anatase phase composition of TiO2 layers in all-dielectric filters and reflectors of arbitrary design. No special specimen preparation is necessary. Interference effects can enhance Raman scattering compared to single-layer coatings of the same total TiO2 thickness.

© 1984 Optical Society of America

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