Abstract

The identification method is based on approximations of the reflection coefficient r by terms of the Bremmer series. One of these supplies an explicit representation of the refractive-index profile n, utilizing the Fourier transform Fr of r. Various procedures for the identification of thin-film systems using fast Fourier transform are derived from this relationship between Fr and n. One main issue of this paper is the determination of jumps within the refractive-index profile. For this purpose a numerical representation of Fr is subjected to waveform analysis. Theoretical and algorithmic aspects of the method are investigated, including a critical discussion in connection with numerical experiments.

© 1983 Optical Society of America

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