Abstract

The design of a mechanical nanosecond light pulsing system which tests the optical response time of a semiconductor film is discussed. The system consists of a high speed rotating mirror which is used to scan a laser beam across a film target. The system is capable of producing variable duration light pulses as fast as 3.5 nsec. A discussion of how shorter exposure times may be realized is also presented.

© 1983 Optical Society of America

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